Rotary press-type chip testing fixture

A chip testing, rotating and pressing technology, which is applied in the direction of single semiconductor device testing, semiconductor/solid-state device testing/measurement, measuring devices, etc., can solve problems such as chip damage, and achieve the effect of fast and convenient chip installation and disassembly

Inactive Publication Date: 2016-09-07
WUXI HI NANO TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In the semiconductor packaging and testing process, after dicing, the unpackaged bare chip needs to test the dynamic parameters of its single die, because it has a dicing machine, if the lead is directly soldered to the chip, it will cause damage to the chip, if it is quickly However, it is a problem in the prior art to efficiently test unpackaged chips.

Method used

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  • Rotary press-type chip testing fixture

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Experimental program
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Effect test

Embodiment Construction

[0009] figure 1 It is a structural representation of the present invention. The present invention includes a bracket, which includes a base 1 with a horizontal plane and a vertical support rod 2; a hollow columnar support frame 4 with a spiral pattern on the inner wall is fixed on the support rod 2; a lower bottom with a spiral pattern on the outer wall Press rod 5; the spiral pattern on the inner wall of the support frame 4 and the spiral pattern on the outer wall of the lower press rod 5 match each other; the lower end of the lower press bar 5 is provided with an upper test needle 7, and the upper end of the lower press bar 5 is provided with a handle 6. A chip placement platform 3 is fixed on the base platform 1, and a chip positioning rod is arranged on the upper surface of the chip placement platform 3. The chip placement platform 3 is also provided with a through hole, and a lower test needle 8 is fixed in the through hole.

[0010] During the test, the chip to be teste...

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PUM

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Abstract

This invention discloses a rotary press-type chip testing fixture. The testing fixture comprises a bracket; the bracket comprises a base with a horizontal plane and an upright supporting bar; a hollow columnar supporting rack provided with thread on the inner wall is fixed on the supporting bar; the testing fixture further comprises a pushing rod provided with thread on the outer wall; the thread on the inner wall of the supporting rack is matched with the thread on the outer wall of the pushing rod; an upper testing needle is arranged at the lower end of the pushing rod; a handle is arranged at the upper end of the pushing rod; a chip placing table is fixed on the base; a chip locating rod is arranged at the upper surface of the chip placing table; the chip placing table is further provided with a through hole; and a lower testing needle is fixed in the through hole. The chip testing fixture provided by the invention is applicable to the test of the unpackaged chip, can locate and quickly test the chip, can quickly and conveniently install and disassemble the chip without welding the testing pin on the chip, and is applicable to mass test.

Description

technical field [0001] The invention relates to semiconductor packaging and testing technology, in particular to a rotating and pressing type chip testing fixture. Background technique [0002] In the semiconductor packaging and testing process, after dicing, the unpackaged bare chip needs to test the dynamic parameters of its single die, because it has a dicing machine, if the lead is directly soldered to the chip, it will cause damage to the chip, if it is quickly However, efficient testing of unpackaged chips is a problem in the prior art. Contents of the invention [0003] Aiming at the deficiencies of the prior art, the invention discloses a rotating and pressing type chip test fixture. [0004] Technical scheme of the present invention is as follows: [0005] A kind of rotary down-press type chip test fixture, comprises bracket, and described bracket comprises the abutment with horizontal plane and vertical shape support rod; The hollow cylindrical support frame wi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/66G01R1/04G01R31/26
CPCH01L22/34G01R1/04G01R1/0425G01R31/26
Inventor 吕耀安
Owner WUXI HI NANO TECH
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