Microscopic Imaging Method Based on Partial Fourier Space

A Fourier space, microscopic imaging technology, applied in the imaging field, can solve the problems of long exposure time, limited application, affecting the speed of a single high-resolution image, etc., to achieve the effect of improving the iteration speed and expanding the scope of application

Inactive Publication Date: 2019-04-09
SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, there are still some problems in the current FPM method, which limit the application of this method.
The most important is the time-consuming problem of the method
In order to improve the resolution, the FPM method requires a large number of low-resolution images under LED illumination at different angles, and when the illumination angle is large, due to the limited light intensity of the LED, a longer exposure time is required. These factors lead to the cost of the FPM method. Too much time is spent on collecting low-resolution images, which affects the speed of obtaining a single high-resolution image, and also restricts the wide application of this method

Method used

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  • Microscopic Imaging Method Based on Partial Fourier Space
  • Microscopic Imaging Method Based on Partial Fourier Space
  • Microscopic Imaging Method Based on Partial Fourier Space

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Embodiment Construction

[0055] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0056] In the description of the present invention, it should be understood that the terms "first" and "second" are used for description purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly indicating the quantity of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of said features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0057] In the descr...

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Abstract

The invention discloses a microscopic imaging method based on a partial Fourier space, comprising the following steps: S1, collecting microscopic images of a sample under multi-angle lighting; and S2, getting a whole high-resolution image through an iteration process of a PFPM method. Step S1 includes collecting a central image of the sample and multiple images obtained under lighting of a half light matrix in a set range. Step S2 includes the sub steps of processing the central image to get an iterative initial figure of Fourier space, iteratively updating the multiple images one by one according to the iterative initial figure to complete a round of iteration, performing a plurality of rounds of iteration to get the Fourier space of the high-resolution image, and filling in the missing data according to the Fourier space of the high-resolution image and based on the conjugate symmetry of Fourier transform to generate a whole high-resolution image. Through the microscopic imaging method based on a partial Fourier space, the iteration speed is increased. The application scope of the microscopic imaging method based on a partial Fourier space is expanded.

Description

technical field [0001] The invention relates to the field of imaging, more specifically, to a microscopic imaging method based on partial Fourier space. Background technique [0002] With the development of science and technology, there is an increasing demand for detecting biological structures with different properties on a micro scale. However, traditional optical microscopes are limited by the diffraction limit, resulting in limited resolution. Under this demand, super-resolution microscopy technology came into being. [0003] One of the super-resolution microscopy techniques is called Fourier Ptychography Microscopy (FourierPtychography Microscopy, hereinafter referred to as FPM method). This technique can obtain super-resolution images as long as a simple improvement is made on the traditional optical microscope. The technique was originally published by Guoan Zheng in the journal Nature Photonics in 2013. The principle of this method is to replace the microscope li...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T3/40G02B21/36
CPCG02B21/367G06T3/4076
Inventor 段侪杰孟宏宇马辉沈宏迟颖
Owner SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
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