Device for measuring displacement and deformation of high-temperature object on basis of structured light and digital speckles

A technology for digital speckle and high-temperature objects, which is applied in the optical field and can solve problems such as difficult to strategic long-distance high temperature

Active Publication Date: 2016-12-07
BEIJING ZHENXING METROLOGY & TEST INST
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Problems solved by technology

[0004] In view of the above analysis, the present invention aims to provide a device for measuring the displacement and deformation of high-temperature objects based on structur

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  • Device for measuring displacement and deformation of high-temperature object on basis of structured light and digital speckles
  • Device for measuring displacement and deformation of high-temperature object on basis of structured light and digital speckles

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[0029] Preferred embodiments of the present invention will be specifically described below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of the application and are used together with the embodiments of the present invention to explain the principles of the present invention. Elements and features described in one drawing or one embodiment of the present invention may be combined with elements and features shown in one or more other drawings or embodiments. It should be noted that representation and description of components and processes that are not relevant to the present invention and known to those of ordinary skill in the art are omitted from the drawings and descriptions for the purpose of clarity.

[0030] Such as figure 1 as shown, figure 1 It is a schematic structural diagram of the device described in the embodiment of the present invention, which may specifically include:

[0031] Structured light laser 1, mainl...

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Abstract

The invention relates to a device for measuring displacement and deformation of a high-temperature object on the basis of structured light and digital speckles. The device comprises a structured light laser device, a laser ranging unit, an optical imaging unit, a photoelectric detection unit and a data processing unit. The structured light laser device is used for outputting single-color structured light and irradiating the surface of the measured object; the laser ranging unit is used for obtaining the distance from the surface of the measured object to the photoelectric detection unit; the optical imaging unit is used for imaging a single-color structured light image of the surface of the measured object on the photoelectric detection unit; the photoelectric detection unit is used for collecting the imaged image and sending the image to the data processing unit; the data processing unit is used for calculating the distance from the image sent by the photoelectric detection unit to the photoelectric detection unit and the distance from the surface of the measured object to the photoelectric detection unit, and the displacement and the deformation of the measured object in the high-temperature state are obtained. The device can be used for measuring the displacement and the deformation of the measured object in the high-temperature state.

Description

technical field [0001] The invention relates to the field of optical technology, in particular to a device for measuring displacement and deformation of a high-temperature object based on structured light and digital speckle. Background technique [0002] Using laser speckle to measure object information has the advantages of non-contact measurement, full-field measurement, and simple measurement optical path. The technology of measuring the position or deformation information of an object based on laser speckle is to use laser speckle to measure the small displacement, deformation, vibration, etc. of the object, but this method is only suitable for objects with low temperature within a short distance (less than 2m). For long-distance high-temperature objects, the high-temperature environment is not conducive to the generation of stable laser interferograms, and the long distance requires high laser power, which is difficult for commonly used lasers to meet the requirements....

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Application Information

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IPC IPC(8): G01B11/02G01B11/16
CPCG01B11/02G01B11/167
Inventor 何立平孙红胜张玉国邱超吴柯萱
Owner BEIJING ZHENXING METROLOGY & TEST INST
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