Double-track profile measuring apparatus
A contour measurement and dual-track technology, which is applied to measuring devices, instruments, and optical devices, can solve problems such as low detection efficiency and cumbersome operation of measurement equipment, and achieve the effects of simple structure, convenient use, and improved detection efficiency
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[0015] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0016] Such as figure 1 Shown: a dual-track profile measuring instrument, including: 2 2D laser sensors 7 and 2 sensor supports 3 arranged in parallel, 2D laser sensors 7 are arranged in the sensor housing 4, and the 2 sensor housings 4 are respectively arranged in two On the two opposite sides of the sensor support 3 and between the two sensor covers 4 are connected by a connecting rod 5;
[0017] One end of the connecting rod 5 is fixedly connected to a sensor s...
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