Chip wireless test circuit and wireless test method

Abstract

The invention provides a wireless testing circuit for a chip, and the wireless testing circuit comprises a testing machine circuit and a chip internal circuit. The testing machine circuit comprises a machine control circuit unit, a machine testing start unit, a machine sampling circuit unit, a machine end NFC control circuit, and a machine end NFC coil. The chip internal circuit comprises a chip end NFC coil, a chip end NFC control circuit unit, a testing excitation generation circuit unit, a logistic_scan_chain unit, a storage unit Memory, a scan test response judgment circuit unit, and an MBIST testing response judgment circuit unit. During testing, the testing machine circuit sends a testing start command to the chip internal circuit. The chip internal circuit generates a testing excitation to perform the testing of the chip, wherein the testing comprises the scanning of the logic circuit of the chip and the memory bist testing. A testing result is transmitted to the testing machine circuit in a wireless manner through NFC. The circuit can carry out the verification and testing of the chip under the condition that there is no physical connection.

Description

technical field [0001] The invention relates to a chip testing technology, in particular to a testing circuit and a testing method for testing a chip without using a physical electrical interface. Background technique [0002] With the rapid development of SOC chip technology, the Internet of Things technology is becoming more and more important. However, an important problem currently restricting IoT chip devices is that all devices and basic chips still rely on traditional physical electrical devices, such as power sockets, debugging sockets, etc. Work in liquid environments such as swimming or bathing or other harsh environments. With the development of technology, there have been some chips that do not need physical connection, but the verification and testing of these chips has become a difficult problem. [0003] Therefore, the present invention proposes a test circuit and a test method, which can perform chip verification and testing without physical connection, whi...

AI Technical Summary

Problems solved by technology

However, an important problem currently restricting IoT chip devices is that all devices and basic chips still rely on traditional physical electrical devices, such as power sockets, debugging sockets, etc. Work in liquid environments such as swimming or bathing or other harsh environments

With the development of technology, there have been some chips that do not require physical connection, but the verification and testing of these chips has become a difficult problem

[0003] Therefore, the present invention proposes a test circuit and a test method, which can perform chip verification and testing without physical connection, which greatly supports and improves the production and development process of chips without physical electrical interfaces. At the same time, the test circuit or If the test method is used on a traditional chip, it can also simplify the complexity of the test equipment design, and can also solve the vulnerability problem of the physical connection equipment

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