Wireless testing circuit and method for chip
A technology of wireless testing and wireless charging, which is applied in the field of testing circuits, can solve problems such as equipment failure, difficulty in chip verification and testing, and dependence on physical electricity, etc., to simplify testing equipment, improve production and development processes, and solve vulnerability problems Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Example Embodiment
[0034] See figure 1 As shown, the wireless test circuit of the chip of the present invention includes a test machine circuit 100 and an on-chip circuit 200;
[0035] The test machine circuit 100 includes a machine control circuit unit 101, a machine test start unit 102, a machine sampling circuit unit 103, a machine side NFC control circuit unit 104, and a machine side NFC coil 105; the machine control circuit unit 101 is connected to the machine-side NFC control circuit unit 104 through the machine-side test activation unit 102 and the machine-side sampling circuit unit 103 respectively, and the machine-side NFC control circuit unit 104 is then connected to the machine-side NFC coil 105, and the The machine control circuit unit 101 is also connected to the machine end NFC control circuit unit 104;
[0036] The on-chip circuit 200 includes a chip-side NFC coil 201, a chip-side NFC control circuit unit 202, a test excitation generating circuit unit 203, a logic_scan_chain unit 204, ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap