Unlock instant, AI-driven research and patent intelligence for your innovation.

Embedded device procedure code segment self-inspection method and device

An embedded device and program code technology, applied in error detection/correction, instrumentation, electrical digital data processing, etc., can solve problems such as program code segment running errors, and achieve the effect of ensuring safety and reliability and avoiding losses

Active Publication Date: 2017-01-25
XUJI GRP +5
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a method for self-inspection of the program code segment of an embedded device, in order to solve the problem that the program code segment of the embedded device goes wrong

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Embedded device procedure code segment self-inspection method and device
  • Embedded device procedure code segment self-inspection method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0019] The present invention provides a method for self-checking the program code segment of an embedded device, and the specific implementation steps are as follows: figure 1 shown.

[0020] First, initialize the object files that need to be parsed and the default value of the self-test task threshold. Parse the target file to obtain the address and size of the program code segment, and copy the data of the program code segment to a designated memory location as a backup code area. Customize the default value of the self-inspection task threshold, including monitoring time interval and data self-inspection granularity. In this embodiment, the default value of the monitoring time interval is set to 10 ms, and the default value of the data self-check granularity is set to 128 bytes.

[0021] Then, the program code segment detection task is performed. When ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an embedded device procedure code segment self-inspection method and device, belonging to field of applied technology in embedded system. The method comprises the steps of analyzing the target document, obtaining locating information In the internal storage of the logging program code area and the length of the code area, making a backup for the backup are of the whole program code in the internal storage; When the program is in operation, conduct real-time comparison and inspection upon program running area and backup area date; Disposing of compared results, if the results are the same, then the data is right, otherwise, the date is wrong, which shall be reported. After the function concerning program code segment self inspection is added, real-time inspection of program code segment could be conducted during the operation of the equipment, in addition, the abnormality may be found immediately. In case of the occurrence of the abnormality, the equipment would record such abnormality and alarm, assist the field working staff in locating the problem and solve the problemto prevent the problem from worsening, rendering irretrievable loss.

Description

technical field [0001] The invention belongs to the technical field of embedded system application, and in particular relates to a method and device for self-inspection of a program code segment of an embedded device. Background technique [0002] The reliability and real-time performance of embedded devices are generally very high. In any case, the reliable operation of the device must be guaranteed. Improving the reliability and real-time performance of the device is the key work of embedded product design. Due to some unpredictable factors or undiscovered potential dangers, the program code segment is abnormal, which may cause unpredictable dangers to the equipment. In this case, it is difficult to guarantee the reliability of the equipment action, and even cause serious consequences to the system. . Contents of the invention [0003] The purpose of the present invention is to provide a method for self-inspection of the program code segment of the embedded device, whic...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F11/36
CPCG06F11/3612
Inventor 宋彦锋杨芳徐云松沈沉左群业张文浮明军张保善刘秋菊杨生苹王西邓裘愉涛
Owner XUJI GRP
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com