Memory depth expansion device applied to ATE digital testing

Abstract

The invention discloses a memory depth expansion device applied to ATE digital testing. A memory, an address generator, a select one from four module and more than four data channels, wherein data in the memory is connected with each data channel respectively; the memory is connected with the address generator through lower-order control; the address generator is connected with the select one from four module through high-order control; the select one from four module is connected with data of four channels in the memory and is connected with the depth channel; and the select one from four module is used for switching the data of any one of four channels onto the depth channel. The memory depth expansion device applied to ATE digital testing adopts flexible mode switching, so that the digital testing equipment can meet the testing demands of small picture depth of high channel number and large picture depth of low channel number.

Description

technical field [0001] The invention belongs to the technical field of memory used in ATE digital test, in particular to a memory depth expansion device used in ATE digital test. Background technique [0002] Graphical vectors in digital test equipment need corresponding memory to store. The memory is divided into dynamic and static. Dynamic memory has a large capacity, but it is inconvenient to use and poor in flexibility. Therefore, a large number of digital test equipment use static memory. Static memory is convenient and flexible to use, but the disadvantage is that its storage capacity cannot be very large. In digital test equipment, there are many channels, so the memory depth that can be allocated to each channel is very small, which obviously cannot meet Usage requirements. Contents of the invention [0003] Purpose of the invention: In view of the deficiencies in the prior art, the purpose of the present invention is to provide a memory depth expansion device app...

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Problems solved by technology

[0002] Graphical vectors in digital test equipment need to be stored in corresponding memory. The memory is divided into dynamic and static. Dynamic memory has a large capacity, but it is inconvenient to use and has poor flexibility. Therefore, a large number of digital test equipment use static memory.

Static memory is convenient and flexible to use, but the disadvantage is that its storage capacity cannot be very large. In digital test equipment, there are many channels, so the memory depth that can be allocated to each channel is very small, which obviously cannot meet Usage requirements

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