Memory depth expansion device applied to ATE digital testing

A technology for expanding devices and digital testing, which is applied in the field of memory and can solve problems such as inability to meet usage requirements, poor flexibility, and large dynamic memory capacity.

Pending Publication Date: 2017-01-25
上海旻艾半导体有限公司
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  • Abstract
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  • Claims
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AI Technical Summary

Problems solved by technology

[0002] Graphical vectors in digital test equipment need to be stored in corresponding memory. The memory is divided into dynamic and static. Dynamic memory has a large capacity, but it is inconvenient to use and has poor flexibility. Therefore, a large number of digital test equipment use static m

Method used

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  • Memory depth expansion device applied to ATE digital testing
  • Memory depth expansion device applied to ATE digital testing

Examples

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Example Embodiment

[0012] The present invention will be further described below in conjunction with specific drawings.

[0013] Such as figure 1 As shown, the memory depth expansion device applied to ATE digital test is equipped with memory, address generator, 4 select 1 module and more than 4 data channels on the data test board. The data in the memory are connected to their respective data channels. The memory is connected to the address generator through the low-level control, and the address generator is connected to the 4-select-1 module through the high-level control. The 4-select-1 module is connected to the 4-channel data in the memory and connected to the depth channel; the 4-select-1 module is used To cut the data of any channel in the 4 channels to the depth channel.

[0014] The depth expansion method of the device takes a 16-channel digital test equipment as an example. In this example, one of every 4 channels has a memory depth expansion function.

[0015] On the board of the digital tes...

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Abstract

The invention discloses a memory depth expansion device applied to ATE digital testing. A memory, an address generator, a 4-to-1 module and more than 4 data channels are arranged on a data test board, and the data in the memory are all related to the respective data The channel is connected, the memory is connected with the address generator through the low-order control, the address generator is connected with the 4-choice 1 module through the high-bit control, the 4-choice 1 module is connected with the 4-channel data in the memory, and connected with the depth channel; the 4-choice Module 1 is used to switch the data of any of the 4 channels to the depth channel. The memory depth expansion device applied to ATE digital test of the present invention adopts flexible mode switching, so that the digital test equipment can meet the test requirements of high channel number, small pattern depth and low channel number, large pattern depth at the same time.

Description

technical field [0001] The invention belongs to the technical field of memory used in ATE digital test, in particular to a memory depth expansion device used in ATE digital test. Background technique [0002] Graphical vectors in digital test equipment need corresponding memory to store. The memory is divided into dynamic and static. Dynamic memory has a large capacity, but it is inconvenient to use and poor in flexibility. Therefore, a large number of digital test equipment use static memory. Static memory is convenient and flexible to use, but the disadvantage is that its storage capacity cannot be very large. In digital test equipment, there are many channels, so the memory depth that can be allocated to each channel is very small, which obviously cannot meet Usage requirements. Contents of the invention [0003] Purpose of the invention: In view of the deficiencies in the prior art, the purpose of the present invention is to provide a memory depth expansion device app...

Claims

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Application Information

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IPC IPC(8): G11C16/08G11C16/24
CPCG11C16/08G11C16/24
Inventor 高爽王浩
Owner 上海旻艾半导体有限公司
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