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A method and device for feature extraction of high-resolution one-dimensional range images

A technology of feature extraction and distance imaging, which is applied in the field of image processing and can solve the problems of inability to extract detailed information and insufficient feature information.

Active Publication Date: 2019-06-14
中国人民解放军海军七〇一工厂
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Problems solved by technology

[0004] In view of this, the present invention discloses a method for feature extraction of a high-resolution one-dimensional distance image, which solves the problem that the feature information extracted in the prior art is not comprehensive enough, and the detailed information cannot be extracted

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  • A method and device for feature extraction of high-resolution one-dimensional range images

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Embodiment Construction

[0073] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0074] refer to figure 1 , shows a schematic flowchart of a method for feature extraction of a high-resolution one-dimensional range image according to an embodiment of the present invention. In this embodiment, the method may include, for example:

[0075] S101: Acquiring a target area of ​​a high-resolution one-dimensional range image;

[0076] In this embodiment, a high-resolution one-dimensional range image of the target to be detected is obtained throug...

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Abstract

The present application discloses a method for feature extraction of a high-resolution one-dimensional range image, including: obtaining a target area of ​​a high-resolution one-dimensional range image, and obtaining the stack energy ratio feature, stack structure ratio feature, and central moment feature of the target area . By obtaining a plurality of stacks of the target area in the smooth image, wherein each stack is composed of a peak in the target area and two valleys adjacent to the peak, the smooth image is the high-resolution one-dimensional distance The image is obtained by rolling and smoothing; the heap energy ratio feature and the heap structure ratio feature of the target area are obtained; the central moment feature of the target area is obtained through the method of segmented half-order central moment extraction of the target area. Therefore, the features of the extracted high-resolution one-dimensional range image are more comprehensive, and more detailed information can be extracted.

Description

technical field [0001] The invention relates to the field of image processing, in particular to a method and device for feature extraction of a high-resolution one-dimensional range image. Background technique [0002] The high-resolution one-dimensional distance is like the projection of the target scattering center in the direction of the radar line of sight, reflecting the radial position relationship between the scattering centers of the target, reflecting some structural characteristics of the target, and is an important way for radar to perceive and identify targets. The feature extraction of high-resolution one-dimensional range images has been the focus of research at home and abroad in recent years. The quality of feature extraction results directly affects the quality of radar target recognition. [0003] In the prior art, there are various feature extraction methods for one-dimensional range images. For example, Liu Xiankang’s academic paper "Satellite Target Reco...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/46
CPCG06V10/50
Inventor 魏存伟刘先康孙菲任杰杨欧卢文良柳建东郭瑞红
Owner 中国人民解放军海军七〇一工厂