Electrical insulation film pulse voltage accelerated aging experiment electromagnetic acting force generating device
A technology of electromagnetic force and pulse voltage, applied in the direction of measuring device, measuring electricity, measuring electrical variables, etc., can solve the problems of not considering the influence of insulation aging speed, and the insulation life model not considering electromagnetic force and so on.
Active Publication Date: 2017-03-22
GUILIN UNIVERSITY OF TECHNOLOGY
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Problems solved by technology
The currently used pulse electrical stress insulating film accelerated aging test device only includes three stress factors of pulse voltage amplitude, frequency, and temperature, and is mainly used to study the influence of pulse voltage amplitude, pulse frequency, and temperature stress factors on insulation life. The influence of mechanical stress generated by electromagnetic mechanical force on the aging speed of insulation has not been considered, and the insulation life model based on these studies has not considered the influence of electromagnetic force
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[0015] Electromagnetic force generating device for pulse voltage accelerated aging experiment of electrical insulation film, including high-voltage pulse power supply 1, flexible high-voltage wire 2, upper electrode 3, lower electrode 5 and excitation power supply 7. The upper electrode 3 is a cylinder made of soft magnetic conductor material, with an outer diameter of 25 mm and a height of 25 mm. An M4 threaded hole is set at the position marked A on the upper part of the upper electrode 3 for connecting the P of the high-voltage pulse power supply 1. U At the output end, the lower plane of the upper electrode 3 is chamfered and ground to serve as the conductive contact surface of the insulating film sample 4 . The lower electrode 5 is composed of a soft magnetic conductor material divided into N-S poles and an embedded excitation coil 6. The magnetic pole width of the upper plane divided into N-S poles is 3-6mm, and the N-S poles are separated by brass with a width of about 2...
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The invention discloses an electrical insulation film pulse voltage accelerated aging experiment electromagnetic acting force generating device. The device comprises a high-voltage pulsed power source, a flexible high-voltage line, an upper electrode, a lower electrode and an excitation power source; an electrical insulating film sample is arranged between the conductive planes of the upper electrode and the lower electrode; the excitation power source applies pulse excitation current to the excitation coil of the lower electrode so as to generate an electromagnetic mechanical acting force for the electrical insulating film sample between the electrodes; the magnitude and period of the electromagnetic acting force are controlled by controlling the amplitude and period of the pulse excitation current; and electrical stress is applied to a space between the upper electrode and the lower electrode, and the upper electrode, the lower electrode and the electrical insulation film sample are arranged in a temperature-controllable uniform temperature field, so that desired thermal stress can be generated. According to the device of the invention, besides the electric stress and the temperature stress, the stress factor, the electromagnetic acting force is additionally adopted, and therefore, an stress environment to which insulation is subjected to in the operation of electrical equipment can be reflected more comprehensively, and the law of insulation aging under a pulse electrical stress environment is studied more accurately.
Description
technical field [0001] The invention relates to a device for generating electromagnetic force in an electrical insulation film pulse electric stress insulation accelerated aging life test. Background technique [0002] Electrical insulation film is an important electrical basic material, its performance and electrical life directly affect the life and operation safety of electrical equipment. The life of electrical insulating films is mainly affected by electrical stress, thermal stress, and electromagnetic mechanical force. In order to quickly obtain the electrical life information of the electrical insulation film, it is necessary to simulate the stress environment of the electrical insulation film during the operation of electrical equipment, and accelerate the electrical insulation film by appropriately increasing the stress value of the electrical insulation film without changing the insulation failure mechanism. The aging process of the electrical insulation film is c...
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Login to View More IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 蒋存波孔祥丽金红杨家志陈小琴
Owner GUILIN UNIVERSITY OF TECHNOLOGY