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Micrometer automatic calibration device

A technology for verification devices and micrometers, which can be applied to micrometers and other directions, and can solve problems such as complex devices

Inactive Publication Date: 2017-04-19
CHINA JILIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the device can complete the entire verification process and reduce human operations, the device is too complicated, and the selection of standard values ​​still uses traditional gauge blocks. In the long-distance point verification process, it is necessary to splice multiple block gauges and only Scale part of the micrometer

Method used

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  • Micrometer automatic calibration device
  • Micrometer automatic calibration device
  • Micrometer automatic calibration device

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Embodiment Construction

[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0031] see Figure 1-8 , the present invention provides a technical solution: a micrometer automatic verification device, comprising: a rotating mechanism 1, a first fixture 2, a first information collection mechanism 3, a second fixture 4, a grating ruler displacement sensor mechanism 5, a base 6, a second Two image acquisition mechanism 8, mobile platform 9. The rotating mechanism 1 is arranged on the leftmost on the base 6, and the sequence from left to ri...

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Abstract

The invention discloses a micrometer automatic calibration device, which comprises a base; a mobile platform arranged on the base; a first clamp arranged on the base and used for fixing a microdrum of the micrometer; a second clamp arranged on the mobile platform and used for fixing a micrometer holder; a first information acquisition mechanism arranged on the base and used for collecting graduation line information of the micrometer; a second image acquisition mechanism arranged on the mobile platform and used for collecting light and shadow images of the micrometer; a rotating mechanism comprising a large rotating disk, a small rotating disk and a rotation motor, arranged on the base and used for driving the microdrum of the micrometer to rotate; and a grating ruler displacement sensor mechanism arranged at the right side of the base and comprising a scale grating, a support frame and an indication grating. The micrometer automatic calibration device utilizes a high-precision grating ruler displacement sensor, instead of a block gauge, to serve as a standard value of the calibration device, thereby improving accuracy of the calibration result, improving calibration work efficiency and improving automation degree of the calibration process.

Description

technical field [0001] The invention relates to a verification device, in particular to an automatic verification device for a micrometer. Background technique [0002] Micrometer, also known as screw micrometer, centicard, is a precision measuring tool used to measure length, which is more precise than vernier caliper. The micrometer is composed of an anvil, a micrometer screw, a ruler frame, a locking device, a heat insulation device, a fixed sleeve, a differential cylinder and a force measuring device. Micrometers are commonly used to measure the length and outer diameter of objects. At present, the accuracy of the micrometer can be accurate to one thousandth of a millimeter, and the last decimal place needs to be estimated. [0003] Micrometer is one of the most widely used measuring tools in high-precision processing and manufacturing. Its accuracy directly affects the dimensional accuracy of parts and the quality of products. At present, the verification of micromet...

Claims

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Application Information

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IPC IPC(8): G01B3/18
CPCG01B3/18
Inventor 徐志玲陈旺达
Owner CHINA JILIANG UNIV
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