A diffractometer capable of measuring protein crystal data with high precision
A diffractometer and high-precision technology, applied in the field of X-ray diffractometers, can solve problems such as light jitter, sample shaking, and unsatisfactory data, and achieve the effects of accurate measurement data, elimination of influence, and high sensitivity
Active Publication Date: 2019-02-12
SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology
Usually, the acquisition of high-precision experimental data requires a high-stability light source, high-quality protein crystal samples, and a high-stability diffractometer. If the diffraction data is not ideal, it may be that the light has shaken, and it may be the protein crystal. The properties of the sample are not good. It may also be that the sample has shaken. The shake of the sample may also be caused by the shake of the ground, which causes the shake of the diffractometer to affect its stability.
In order to eliminate the influence of the instability of the diffractometer on the diffraction data, it is necessary to quantitatively observe the instability of the diffractometer, judge the status of the sample on the diffractometer, and try to solve the unsatisfactory data caused by the stability of the diffractometer
However, the diffractometers currently on the market lack methods and tools for quantitative real-time monitoring of their stability.
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[0022] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
[0023] refer to Figure 1-7 As shown, a diffractometer capable of measuring protein crystal data with high precision includes an X-ray generating device 4, a control device and an X-ray detecting device 5, and the X-ray detecting device 5 includes an angle measuring head 51 equipped with a sample, and the angle measuring The head 51 is provided ...
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The invention discloses a diffractometer capable of measuring protein crystal data at high precision. The diffractometer comprises an X-ray generation device, an X-ray detection device and a control device, wherein the X-ray detection device comprises a measuring head provided with a sample. The diffractometer is characterized in that a pressure sensing unit used for sensing changes of pressure applied to a to-be-measured sample is arranged on the measuring head. The stability of the diffractometer can be quantificationally monitored, influence of the stability of the diffractometer on sample analysis data is eliminated, and the diffractometer is simple in structure and high in sensitivity and more accurately measures data.
Description
technical field [0001] The invention belongs to the field of X-ray diffractometers, in particular to a diffractometer capable of measuring protein crystal data with high precision. Background technique [0002] X-ray diffraction measurement is an important means to identify the phase structure of biological macromolecules. Usually, the acquisition of high-precision experimental data requires a high-stability light source, high-quality protein crystal samples, and a high-stability diffractometer. If the diffraction data is not ideal, it may be that the light has shaken, and it may be the protein crystal. The poor properties of the sample may also be caused by the shaking of the sample. The shaking of the sample may also be caused by the shaking of the ground, which causes the shaking of the diffractometer to affect its stability. In order to eliminate the influence of the instability of the diffractometer on the diffraction data, it is necessary to quantitatively observe the...
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IPC IPC(8): G01N23/20
CPCG01N23/20008
Inventor 杨利峰汪启胜崔莹何建华
Owner SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI