ITO partitioning method based on local projection

Abstract

The invention discloses an ITO partitioning method based on local projection, belongs to the field of digital image processing, and specifically relates to an ITO partitioning method aiming at a liquid crystal panel IC pressing area. According to the method, an ITO image of a screen is obtained, binarization processing is performed on the image, the width of each ITO and spacing distance are obtained, longitudinal and transverse projection are performed on the binarization image to obtain a characteristic value curve of the two times of projection, and left and right edges of the ITO are calculated according to the obtained characteristic value curve, thereby partitioning the ITO. Thus an ITO region can be accurately partitioned, the speed is fast, and the processing is simple.

Description

technical field [0001] The invention belongs to the field of digital image processing, and in particular relates to an ITO segmentation method for an IC pressing area of ​​a liquid crystal panel. Background technique [0002] With the popularization of smart phones, the traditional LCD panel production mode can no longer meet people's needs for it. Various types of automatic testing equipment based on digital image processing have also emerged at the historic moment. They play a role in improving the production efficiency and quality of LCD panels. played an important role. [0003] The preparation process of the COG of the liquid crystal panel needs to paste a heterogeneous conductive film on the IC pressing area of ​​the glass substrate first, and the conductive particles are evenly distributed in the conductive film, and the diameter of the conductive particles is about 3 to 5 microns. It is non-conductive until pressurized. When a certain temperature and pressure are a...

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Problems solved by technology

When a certain temperature and pressure are applied above the IC, the conductive particles located between the bump area of ​​the IC and the ITO of the glass substrate will be broken, and then the bump electrode of the IC will be conducted with the ITO line, so that the LCD panel can be driven normally. Various screens are displayed; in the process of pressing COG particles, it cannot be guaranteed that all the particles are pressed well. Due to the high precision requirements of pressing, there may be pressure deviation or uneven pressure in some areas, so that As a result, the display of the LCD panel is poor, so the detection of COG particles is an essential part of the production process of the LCD panel. However, due to the large number of COG particle areas, thousands of particle areas are distributed on one LCD panel, so relying on the current artificial mirror The inspection method can only realize partial sampling inspection, which seriously restricts the production efficiency and production quality

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