A global mppt method and device under uneven illumination
A technology with uneven and global illumination, applied in photovoltaic power generation, instruments, and regulation of electrical variables, etc., can solve problems such as waste of photovoltaic power generation power and low efficiency of global scanning methods, and achieve improved power generation efficiency, accurate tracking, strong research significance and Use value effect
Active Publication Date: 2018-06-26
STATE GRID CORP OF CHINA +2
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[0007] The invention provides a global MPPT method under uneven illumination, which is used to solve the problem of waste of photovoltaic power generation caused by the low efficiency of the global scanning method
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[0051] The main idea of the present invention is: when it is judged that the photovoltaic array has different illumination condition areas, that is, there is local shadow occlusion, it does not scan the entire characteristic curve to obtain the global maximum power point like the existing global scanning method, but in a jumping way Scan the short-circuit current near the maximum power point of each illumination condition area, find the maximum value of the maximum power point in each illumination condition area, and then find the global maximum power point by related methods, and then execute the conventional maximum power point tracking algorithm.
[0052] Combine below Figure 1-Figure 4 Be specific. The method of the present invention is implemented in the form of software, and is used for execution in the control system of the photovoltaic power station. There are many specific implementation methods of the software, and the present invention will not introduce them one...
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The invention discloses a global MPPT (Maximum Power Point Tracking) method and device under uneven illumination. When a photovoltaic array is judged to have different illumination condition regions, i.e., when the photovoltaic array is judged to be locally shielded by shadows, different from the prior art in which an entire feature curve is scanned in a global scanning mode to acquire a global maximum power point, according to the global MPPT method and device, a short-circuit current near maximum power points in each illumination condition region is scanned in a jumping mode, a maximum value in the maximum power points in each illumination condition region is searched, and then after a global maximum power point is found, a general MPPT algorithm is executed. According to the global MPPT method and device disclosed by the invention, when an effect of improving power generation efficiency of a photovoltaic system is achieved, operation and maintenance staffs can be helped to rapidly position a shadow fault, so that operation and maintenance efficiency and entire power generation benefits of a power station are further promoted.
Description
Technical field: [0001] The invention relates to the technical field of maximum power point tracking of a photovoltaic power generation system, in particular to a global maximum power point tracking method under uneven illumination. Background technique: [0002] In photovoltaic power generation systems, MPPT (Maximum Power Point Tracking) has always been one of the core issues that researchers are most concerned about, but in actual operation, due to temporary or frequent local shadows caused by dust, trees, buildings, etc., And the uneven illumination caused by multiple partial shadow occlusions at the same time will occur from time to time and generally exist. Partial shading and uneven illumination will cause photovoltaic array output voltage mismatch and hot spots, which not only cause power loss of the photovoltaic power generation system, but even escalate into serious system failure and safety problems. In practical applications, in order to avoid hot spots in the p...
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IPC IPC(8): G05F1/67
CPCG05F1/67Y02E10/56
Inventor 安友彬张振华刘志文陈干杰刘桂莲牛志雷王晓刚李峰魏贺贺魏小锋吕灵芝赵毅姜东东崔敏
Owner STATE GRID CORP OF CHINA