Test system for CMOS sensor

A CMOS sensor and test system technology, applied in TV, electrical components, image communication, etc., can solve the problems of small number of tests, few test functions, single performance of CMOS sensor circuits and pixels, etc., to improve test convenience and increase functions performance, cost reduction

Active Publication Date: 2017-07-21
嘉准传感科技(湖南)有限公司
View PDF7 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Existing test systems usually can only test the circuit and pixel performance of CMOS sensors, and can only test one CMOS sensor chip
It has the technical problems of few test functions and a small number of tests

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test system for CMOS sensor
  • Test system for CMOS sensor
  • Test system for CMOS sensor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0061] This embodiment provides a test system for CMOS sensors, such as figure 1 , the test system includes a parallel light light box that provides parallel light, the parallel light light box is a DNP light box; the number is 3 lensless CMOS sensors, and the lensless CMOS sensor corresponds to the position of the parallel light during testing; Describe the test board that no lens CMOS sensor is connected, described test board includes the image sensor that is used to collect signal data; Described no lens CMOS sensor and test board are all fixed on test board holder, and described test board holder is fixedly connected to Lifting platform; the test board is connected to the control unit through USB2.0, the control unit is also connected to the lifting platform, and the control unit is connected to the upper computer through a USB cable and serial port; the upper computer is located in the sealed Outside the light box, the rest of the test system is placed in a sealed dark b...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a test system for a CMOS sensor and mainly solves the technical problem that in the prior art, test functions are few and the number of test chips is low. The system provided by the invention comprises a parallel light lamp box; N CMOS sensors without lenses, wherein the CMOS sensors without the lenses correspond to positions of parallel light when the CMOS sensors without lenses are tested; and test boards connected with the CMOS sensors without the lenses, wherein the test boards comprise image sensors for collecting signal data, the CMOS sensors without the lenses and the test boards are fixed on a test board fixing frame, the test board fixing frame is fixed on a lifting platform, the test boards are connected with a control unit through USB2.0, the control unit is also connected with the lifting platform, and the control unit is connected with an upper computer through a USB cable and a serial port. According to the technical scheme, the problem is solved well, and the system can be applied to a performance test of the CMOS sensor.

Description

technical field [0001] The invention relates to the field of sensor testing, in particular to a testing system for CMOS sensors. Background technique [0002] CMOS sensors made with a new process generally need to evaluate the circuit and pixel performance for subsequent mass production with this process. Since it is necessary to evaluate and test the circuit and pixel performance, it is necessary to collect data, and then convert the data to obtain the desired data. Evaluating circuit and pixel performance is a very important link. The number of test chips is relatively large, maybe dozens or even hundreds, and each chip needs to capture many pictures for analysis. The workload is still relatively large. The conditions for each test To be consistent, the test environment needs to be placed in a sealed light box, and the data is collected and calculated through the control system. [0003] Existing test systems usually can only test the circuit and pixel performance of a C...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00
CPCH04N17/00
Inventor 不公告发明人
Owner 嘉准传感科技(湖南)有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap