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Object displacement measurement method, device and system based on image recognition

A measurement method and technology of object displacement, applied in the field of measurement, can solve the problem of difficulty in measuring the relative position of objects, and achieve the effect of simple and efficient measurement method, accurate measurement accuracy, and rapid acquisition.

Inactive Publication Date: 2017-08-29
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0003] The present invention aims to solve the technical problem that it is difficult to measure the relative position of an object in the prior art, and provides an object displacement measurement method based on image recognition, a measuring device and measuring system

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  • Object displacement measurement method, device and system based on image recognition
  • Object displacement measurement method, device and system based on image recognition
  • Object displacement measurement method, device and system based on image recognition

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Embodiment Construction

[0025] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0026] The present invention provides an embodiment of an object displacement measurement method based on image recognition, such as figure 1 As shown, the measurement methods include:

[0027] Step S11, based on the preset target image, acquire the first detected image data of the object at the first position and the second detected image data of the object at the second position;

[0028] Step S12, performing edge detection processing on the first detected image data and the second detected image data to obtain first edge map data corresponding to the first detected image and second edge map data corresponding to the second detected image;

[0029] Step S13, according to the first edge map data corresponding to the first detection image, the second edge map data corresponding to the second detection image and the sub-pixel centroid method...

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Abstract

The invention relates to an object displacement measurement method based on image recognition, and the method comprises the following steps: obtaining first detection image data of an object at a first position and second detection image data of the object at a second position; carrying out the edge detection of the first and second detection image data, obtaining first edge image data corresponding to a first detection image and second edge image data corresponding to a second detection image; carrying out the positioning according to the first edge image data corresponding to the first detection image, the second edge image data corresponding to the second detection image and a centroid method, and obtaining a feature point set corresponding to the first detection image and a feature point set corresponding to the second detection image; obtaining an optimal projection relation matrix of the first and second detection images according to the feature point set corresponding to the first detection image and the feature point set corresponding to the second detection image; obtaining the relative distance of the object between the first and second positions according to a preset focal length, a preset object distance and the optimal projection relation matrix of the first and second detection images.

Description

technical field [0001] The invention relates to the field of measurement technology, in particular to an image recognition-based object displacement measurement method, a measurement device and a measurement system. Background technique [0002] With the development of technology, when the object has a small displacement, it is necessary to measure the relative position of the object, but the existing relative position measurement device has a large measurement error in the measurement process and cannot meet the accuracy requirements; However, another existing relative position measuring device can only measure the tiny displacement of the object when it is in contact with the object during the measurement process, but the contact measurement will easily cause scratches or scratches on the surface of the object, and it cannot meet the measurement requirements. . Contents of the invention [0003] The present invention aims to solve the technical problem that it is diffic...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/02
CPCG01B11/022
Inventor 陈长征聂婷何斌薛金来
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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