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A spectrometer system and a method for compensating for time periodic perturbations of an interferogram generated by the spectrometer system

A spectrometer and interferogram technology, which is applied in the disturbance field of the interferogram, can solve problems affecting the performance of the spectrometer system, distinguishing disturbances from real signals, etc.

Inactive Publication Date: 2017-11-28
FOSS ANALYTICAL AS
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Problems solved by technology

[0006] Such time-periodic perturbations can adversely affect the performance of spectrometer systems, since it is impossible to distinguish these perturbations from real signals without prior knowledge of their nature

Method used

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  • A spectrometer system and a method for compensating for time periodic perturbations of an interferogram generated by the spectrometer system
  • A spectrometer system and a method for compensating for time periodic perturbations of an interferogram generated by the spectrometer system
  • A spectrometer system and a method for compensating for time periodic perturbations of an interferogram generated by the spectrometer system

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Embodiment Construction

[0022] now consider the figure 1 The exemplary spectrometer system 2 shown schematically in , comprises a scanning interferometer 4; a drive system 6; a detector arrangement 8; and a data processor 10. The scanning interferometer 4 is a Michelson-type scanning interferometer in this embodiment, which basically includes a fixed mirror 12, a movable mirror 14 that can reciprocate and translate, and is arranged with respect to the fixed mirror 12 and the movable mirror 14. The beam splitter 16 splits the incident light beam 18; 20 into a first part 22; 24 and a second part 26; 28 of substantially equal intensity. The first part 22 ; 24 is reflected by the beam splitter 16 , traveling along a first arm delimited by the fixed mirror 12 from which the first part is reflected back to the beam splitter 16 . The second part 26; 28 is transmitted through the beam splitter 16 for movement along the second arm, delimited by a reciprocally translatable movable mirror 14 from which the sec...

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Abstract

The present invention relates to a spectrometer system and a method for compensating for time periodic perturbations of an interferogram generated by the spectrometer system. The spectrometer system (2) comprises a scanning interferometer (4); a drive system (6) mechanically coupled to a movable reflector element (14) of the scanning interferometer (4) and operable to effect reciprocation of the movable reflector element (14)at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement (8) configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer (2) to generate a sampled interferogram; and a data processor (10) adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.

Description

technical field [0001] The present invention relates to spectrometer systems and methods for compensating for time-periodic perturbations of interferograms produced by spectrometer systems, particularly those of interferograms recorded using spectrometer systems comprising scanning Fourier transform (FT) interferometers. Background technique [0002] It is known to provide spectrometer systems with scanning FT interferometers such as Michelson type. An interferometer broadly comprises a beam splitter and two or more reflectors, such as mirrors or reflectors, wherein at least one reflector is arranged reciprocally movable. Collimating lenses or other optics can also be included in an interferometer, but are not fundamental to how it works. [0003] Typically, for example when such interferometers are used in spectroscopy, an observation beam consisting of relatively broadband radiation in the wavelength region of interest enters the interferometer, typically after interactin...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45G01J3/453
CPCG01J3/45G01J3/4535G01J3/06
Inventor S·K·安徒生M·L·安徒生
Owner FOSS ANALYTICAL AS
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