SAR image target recognition method based on multilayer probability statistics model
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- XIDIAN UNIV
- Publication Date
- 2017-12-01
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of SAR image target recognition, and in particular relates to SAR image feature extraction, in particular to a SAR image target recognition method based on a multi-layer probability statistical model, which can be used for SAR image feature extraction and SAR image target recognition. Background technique
[0002] SAR image target recognition has important military value and commercial value, and has been a hot research topic at home and abroad. Although the field of target recognition has been greatly developed in recent years, it is still a challenging task to complete SAR image target recognition accurately and quickly. Feature extraction is a very critical step in SAR image target recognition. The quality of the extracted features directly affects the recognition performance of SAR image targets. Therefore, it is necessary to carry out meaningful feature extraction on SAR images to improve the performanc...