A Fast Computational Method for Multilayer Brightness Temperature Tracking in Passive Millimeter-Wave Imaging Simulations

Abstract

The present invention discloses a fast calculation method of multi-layer brightness temperature tracking in passive millimeter wave imaging simulation, belongs to the field of computer-aided analysisand design and software design, and is mainly used for passive millimeter wave imaging simulation. The invention aims to find distribution characteristics and the rule of a rough surface scattering coefficient through calculating a double-station scattering coefficient of a rough surface for the special distribution of the rough surface scattering coefficient and find a corresponding sub-layer rayemission method according to the rule. According to the method, rays of an area with a small double-station scattering coefficient are scattered, rays in an area with a large double-station scattering coefficient are intensified, thus the redundant calculation of the rays is avoided, the calculation efficiency is improved, and the fast calculation of a multi-layer brightness temperature trackingmethod is realized.

Description

technical field [0001] The invention relates to a fast calculation method, which belongs to the technical field of computer-aided analysis and design, and is mainly used for passive millimeter-wave imaging simulation simulation, which can improve the calculation efficiency of the multi-layer brightness temperature tracking method and help realize rapid imaging of complex scenes. Background technique [0002] Passive millimeter-wave imaging simulation is an important link in the field of passive millimeter-wave imaging. It can help to understand the radiation characteristics of targets, explain radiation phenomena, find radiation laws and judge the pros and cons of actual measurement results. The advantages mentioned above have made millimeter wave imaging simulation more and more important in recent years. So far, most of the work has focused on the scene where the surface of the target to be measured is a smooth plane, but there is little mention of the scene where the surf...

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Problems solved by technology

[0003] figure 1 The ray emission method in is the method of uniform emission according to the angle. Its disadvantage is that it cannot be evenly distributed on the spherical surface, resulting in the rays near θ = 0° being much denser than those near θ = 90°. This method can be better The calculation of the scattering amplitude coefficient of the rough surface, so as to obtain its reflectivity and emissivity

Unfortunately, this ray distribution characteristic will cause a large amount of redundancy in the calculation, which in turn will cause a significant reduction in the calculation efficiency of the multi-layer brightness temperature tracking method

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