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Detection method for identifying surface defects of super-thin transparent plate based on mirror reflection

A specular reflection and surface defect technology, applied in the direction of optical testing defects/defects, can solve the problems of increased workload, explosion, device heating, etc., and achieve the effect of simple method and accurate detection results

Active Publication Date: 2018-04-17
NANJING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] During the production process of display devices such as screens, if there are cracks or fine dust on the surface, these defects will have a great impact on the performance of the products produced, which may cause the device to heat up, fail to display normally, or even explo

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  • Detection method for identifying surface defects of super-thin transparent plate based on mirror reflection
  • Detection method for identifying surface defects of super-thin transparent plate based on mirror reflection

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Embodiment Construction

[0018] The specific implementation method of the present invention will be further described below in conjunction with the accompanying drawings, so as to clearly demonstrate the characteristics of the present invention.

[0019] Such as figure 1 , figure 2 As shown, this embodiment is based on specular reflection to identify tiny flaws on the upper and lower surfaces of an ultra-thin transparent plate. The device used includes a common light source 1, a transparent thin plate 2 to be detected, a light screen 3 for receiving transmitted light, and a light screen for receiving specularly reflected light. The light screen 4. Ordinary light source 1 can use ordinary LED lights, lasers, or household lamps and other light sources. The detected transparent thin plate 2 is placed vertically and forms a certain angle with the incident light. This angle only needs to meet the requirements of light screen 3 and light screen 4. It only needs to be able to receive the transmitted light...

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Abstract

The invention discloses a detection method for identifying surface defects of a super-thin transparent plate based on mirror reflection. The detection method comprises the following specific steps: irradiating one side of a to-be-detected super-thin transparent plate by virtue of a light source, wherein transmission light passing through the to-be-detected super-thin transparent plate and mirror reflection light are respectively received by a first photosensitive device and a second photosensitive device; determining that defects are located on the surface, close to the light source, of the super-thin transparent plate if dark spots simultaneously appear on the two photosensitive devices; determining that defects are located on the surface, far from the light source, of the super-thin transparent plate if a dark spot appears on the first photosensitive device and does not appear on the second photosensitive device; and determining that the super-thin transparent plate does not have defect when the dark spot is not observed on the first photosensitive device and the second photosensitive device. The detection method is simple and efficient, a detection result is accurate, and the micro-scale detection of tiny defects on the upper and lower surfaces of a super-thin plate can be rapidly realized.

Description

technical field [0001] The invention relates to the application field of automatic detection and identification, in particular to a method for real-time identification of defects such as tiny dust and scratches on an ultra-thin transparent plate based on mirror reflection, and can distinguish whether the defects are located on the upper surface or the lower surface of the plate . Background technique [0002] Optical displays permeate every aspect of people's life and production. With the development of science and technology, display devices are becoming thinner and lighter, and some companies have produced new ultra-thin flexible display screens, the thickness of which can reach the order of microns. While the revolutionary rapid development of display devices, some new problems that are difficult to solve have also arisen. [0003] During the production process of display devices such as screens, if there are cracks or fine dust on the surface, these defects will have a...

Claims

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Application Information

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IPC IPC(8): G01N21/94
CPCG01N21/94
Inventor 徐飞田云飞
Owner NANJING UNIV
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