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A screening and evaluation method for high-yield, multi-resistance and high-quality wheat varieties

A technique for evaluating methods and varieties, applied in the fields of botanical equipment and methods, material inspection products, instruments, etc., which can solve problems that do not involve high wheat and high yield potential, etc.

Active Publication Date: 2020-03-27
HENAN AGRICULTURAL UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the two patents CN201510643293.x and CN201410778295.5 are aimed at wheat drought tolerance or water-saving performance, and do not involve high wheat yield potential, especially the pros and cons of wheat quality indicators; while CN201510123489.6 uses a gluten peak meter to measure Rapid Prediction of Wheat Quality

Method used

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  • A screening and evaluation method for high-yield, multi-resistance and high-quality wheat varieties
  • A screening and evaluation method for high-yield, multi-resistance and high-quality wheat varieties
  • A screening and evaluation method for high-yield, multi-resistance and high-quality wheat varieties

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Embodiment 1

[0060] The invention provides a method for screening and evaluating high-yield, multi-resistance and high-quality wheat varieties, the specific steps are as follows:

[0061] (1) Experimental design

[0062] From 2016 to 2017, five test sites were selected in Kaifeng, Yuanyang, Nanle, Xiping, and Xihua. A total of 31 varieties were tested. The plot area of ​​each test site was not less than 13 square meters, repeated three times, and field Fertilize and irrigate according to the high-yield water and fertilizer management field, and set up a water deficit management field control experiment at the Yuanyang test site, repeating 3 times;

[0063] (2) Production data collection

[0064] At the maturity stage, each plot harvests wheat in a 4 square meter quadrat, threshes, weighs after drying, and converts the actual yield according to the water content of 13%; the average grain yield of 3 repeated planting plots is used as the variety grain yield;

[0065] (3) Yield data analys...

Embodiment 2

[0094] (1) Experimental design

[0095] From 2016 to 2017, 6 test sites were selected in Shangshui, Xuchang, Qixian, Xiangcheng, Luoyang and Shangqiu, with a total of 31 varieties. The plot area of ​​each test site is not less than 13 square meters, repeated 3 times, and the field management is based on the high-yield water management field for fertilization and watering. At the same time, a water deficit management field experiment was set up in Shangqiu, with 3 repetitions.

[0096] (2) Production data collection

[0097] At the maturity stage, each plot harvests wheat in a 4 square meter quadrat, threshes, weighs after drying, and converts the actual yield according to the water content of 13%; the average grain yield of 3 repeated planting plots is used as the variety grain yield;

[0098] (3) Yield data analysis under high yield conditions

[0099] The yield data of each variety in the 6 pilot high-yield water and fertilizer management plots were analyzed, and the ave...

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Abstract

The invention relates to a screening and evaluation method of a high yield and multi-resistant wheat variety. The method comprises the following steps of 1, selection of test field; 2, selection of wheat variety for test; 3, setting of planting conditions; 4, yield data collecting in the condition of high yield water and fertilizer management field planting; 5, yield data in the condition of watershortage management field planting; 6, yield data standardization processing; 7, quality index measurement; 8, quality index standardization processing; 9, according to analytic hierarchy process, respectively determining and evaluating bake variety and stewing variety each index weight value; 10, calculating all test bake varieties evaluation comprehensive score or calculating stewing variety comprehensive score. The method can comprehensively evaluates wheat high yield potential, stress resistance and food quality superiority.

Description

technical field [0001] The invention belongs to the technical field of agricultural planting, and in particular relates to a method for screening and evaluating high-yield, multi-resistance and high-quality wheat varieties. Background technique [0002] Wheat is the most widely planted food crop in the world. Its grain is rich in starch, protein, fat, various minerals and vitamin B. It has high nutritional value and is the main source of food for many countries in the world. my country is one of the countries with the largest wheat production and consumption in the world. The wheat planting area accounts for about 27% of the total grain planting area; the total output accounts for about 22% of the total grain output. With population growth and social and economic development, my country's food demand continues to grow rigidly. Relying on scientific and technological progress to increase per unit yield and ensure national food security has always been a major and long-term st...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A01G22/20A01H1/04G01N33/00G01N33/10
CPCA01H1/04G01N33/0098G01N33/10
Inventor 马冬云王晨阳侯阁阁黄鑫谢迎新方保停黄明贾殿勇
Owner HENAN AGRICULTURAL UNIVERSITY