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A detection method of oled brightness

A detection method and brightness technology, applied in the testing of machine/structural components, measuring devices, optical instrument testing, etc., can solve problems such as low work efficiency, misjudgment, and substandard brightness of modules

Active Publication Date: 2020-12-22
TRULY SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Trial binding is the safest way, but the work efficiency is extremely low
However, the brightness achieved by general voltage detection (the most commonly used detection method for the largest chip) or current detection is only below 10,000 nits, which is not very practical for the brightness of analog modules (generally between tens of thousands of nits and hundreds of thousands of nits). Leading to misjudgment, resulting in the brightness of a large number of modules not meeting the standard

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0037] A method for detecting OLED brightness, comprising the steps of:

[0038] Step 1: providing a large-sized OLED motherboard, the OLED motherboard includes a plurality of OLED display panels spaced apart from each other;

[0039] Step 2: Select an OLED display panel located at the edge of the OLED motherboard from among the plurality of OLED display panels of the above-mentioned OLED motherboard, and set a detection block composed of 9 pixels closely arranged in the area of ​​the OLED display panel. The OLED display panel where the detection block is located is provided with positive and negative input lines to input voltage, so that the detection block uses voltage driving to light up the pixels in the detection block, and the voltage is adjusted so that the pixel brightness in the detection block is at 10,000 nits Change within the range of 200,000 nits;

[0040] The shape of the detection block is square or circular; the number of detection blocks in the same OLED dis...

Embodiment 2

[0045] A method for detecting OLED brightness, comprising the steps of:

[0046]Step 1: providing a large-sized OLED motherboard, the OLED motherboard includes a plurality of OLED display panels spaced apart from each other;

[0047] Step 2: Select an OLED display panel located at the edge of the OLED motherboard from the plurality of OLED display panels of the above-mentioned OLED motherboard, and set a detection block consisting of 16 pixels closely arranged in the area of ​​the OLED display panel. The OLED display panel where the detection block is located is provided with positive and negative input lines to input voltage, so that the detection block uses voltage driving to light up the pixels in the detection block, and the voltage is adjusted so that the pixel brightness in the detection block is at 10,000 nits Change within the range of 200,000 nits;

[0048] The shape of the detection block is square or circular; the number of detection blocks in the same OLED display...

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PUM

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Abstract

The invention discloses a detection method of OLED brightness. The detection method comprises the following steps: 1, providing a large-size OLED mother board, wherein the OLED mother board comprisesa plurality of OLED display panels which are mutually spaced; 2, selecting one of the OLED display panels, wherein a detection block, which is formed by densely arranging several or several dozens ofpixels, is arranged in an area of the OLED display panel, the OLED display panel where the detection block is located is provided with positive and negative electrode input lines, and pixel brightnessin the detection block is changed by regulating voltage; 3, acquiring brightness data of the detection block which undergoes mass production, and in accordance with brightness situation of an OLED module which is made by the OLED display panel where the detection block is located and an OLED module brightness standard, confirming a brightness detection standard of the detection block under the voltage; and 4, confirming whether the brightness of the to-be-detected detection block under the corresponding voltage is located within the brightness detection standard or not. The detection method provided by the invention, without cutting the OLED mother board into individual OLED display panels, can conveniently and rapidly detect whether the brightness of the OLED mother board reaches requirements or not.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a method for detecting the brightness of an OLED. Background technique [0002] Organic electroluminescent devices (OLEDs) have broad applications in the fields of next-generation high-resolution new displays, special light sources for sensors, and solid-state lighting due to their excellent properties such as high luminous efficiency, rich colors, mechanical flexibility, and ultra-thin portability. prospect. [0003] Brightness is one of the important parameters to characterize the performance of OLED. For OLED modules, it is a basic requirement for the product to meet the brightness defined in the specification. The premise of controlling the brightness of OLED modules is to ensure that the brightness of large panels before cutting reaches the standard. The commonly used method to detect and control the brightness of large panels is to initially determine the brightness sta...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/00G09G3/3208G01M11/02
CPCG01M11/00G09G3/006G09G3/3208
Inventor 罗志猛赵云张为苍
Owner TRULY SEMICON