Single-piece permeameter, device for measuring single-piece test sample and measuring method

A technology of measuring device and magnetic permeability meter, which is applied in the direction of measuring device, magnetic property measurement, and magnetic variable measurement, can solve problems such as poor adaptability, error, and complicated operation, and achieve improved accuracy, improved adaptability, and simple and convenient operation Effect

Active Publication Date: 2018-06-29
GLOBAL ENERGY INTERCONNECTION RES INST CO LTD +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to overcome the large error in the prior art that the single-chip magnetic permeability meter adopts a single H coil to measure the magnetic field strength of the sample to be tested; and the existing single-chip magnetic permeability meter has poor adaptability to samples. The operation is complicated when comparing the uniformity of the sample area, requiring the use of different sizes of magnetic permeability meters and frequent replacement of samples

Method used

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  • Single-piece permeameter, device for measuring single-piece test sample and measuring method
  • Single-piece permeameter, device for measuring single-piece test sample and measuring method
  • Single-piece permeameter, device for measuring single-piece test sample and measuring method

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Embodiment 1

[0024] An embodiment of the present invention provides a single-chip permeability meter, such as figure 1 As shown, the single-chip permeability meter includes: a U-shaped double yoke 1 , a frame 2 , a primary winding 3 , a pair of H coils 4 , and a secondary winding 5 . Among them, the frame 2 is located between the U-shaped double yokes 1; the primary winding 3 is distributed on the frame 2. In actual testing, the sample 6 to be tested is placed in the frame 2, the H coil pair 4 includes two H coils, and the H coil pair 4 is located under the sample; the secondary winding 5 is located inside the primary winding 3, and the secondary winding 5 includes two Three winding sub-windings: left winding 51, middle winding 52, right winding 53, left winding 51, middle winding 52 and right winding 53 are provided with input port and output port respectively, through accessing different sub-windings The input port and the output port are selected to be connected to one or more of the l...

Embodiment 2

[0033] An embodiment of the present invention provides a single-chip sample measuring device, such as image 3 As shown, it includes: an AC magnetizing power supply 210, a non-inductive precision resistor 220, a measuring device 230, and a single-chip permeability meter 240, wherein the single-chip permeability meter 240 can be the single-chip permeability meter described in Embodiment 1 above. Please refer to the description in Embodiment 1 for details, and details will not be repeated here.

[0034] The AC magnetizing power supply 210 is used to supply power for the monolithic permeability meter 240; one end of the non-inductive precision resistor 220 is connected to the AC magnetizing power supply 210, and the other end of the non-inductive precision resistor 220 is connected to the monolithic permeability meter 240; the measuring device 230 is used to measure the induced voltage of the H coil pair 4 and the induced voltage of the secondary winding 5 in the single-chip permea...

Embodiment 3

[0052] An embodiment of the present invention provides a method for measuring a single piece of sample, such as Figure 4 As shown, the single-piece sample measurement method can be applied to the single-piece sample measurement device described in Embodiment 2, including:

[0053] Step S1: placing the sample 6 to be tested in the single-chip magnetic permeability meter 240;

[0054] Step S2: Connect the input ports and output ports of different sub-windings to select one or more of the left winding, the middle winding, and the right winding;

[0055] Step S3: Measure the induced voltage of the H coil pair 4 and the induced voltage of the secondary winding 5 in the monolithic permeability meter 240, and calculate the sample 6 to be tested according to the induced voltage of the H coil pair 4 and the induced voltage of the secondary winding 5 magnetic parameters.

[0056] Specifically, the above single-chip sample measurement method adopts the H-coil test method, and uses the...

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Abstract

The invention provides a single-piece permeameter, a device for measuring a single-piece test sample and a measuring method. The single-piece permeameter comprises U-shaped double magnetic yokes, a frame, a primary winding, an H coil pair and a secondary winding, wherein the frame is positioned between the U-shaped double magnetic yokes; the primary winding is distributed on the frame; a to-be-tested test sample is arranged in the frame; the H coil pair is positioned below the to-be-tested test sample; the secondary winding is positioned in the primary winding; the secondary winding comprisesthree sub-windings which wind separately, namely a left-side winding, a middle winding and a right-side winging; each of the left-side winding, the middle winding and the right-side winding is provided with an input port and an output port; and one or more of the left-side winding, the middle winding and the right-side winding are selected to connect by connecting the input ports and the output ports of different sub-windings. Through implementation of the invention, the accuracy of measuring the intensity of the magnetic field of the to-be-tested test sample is improved; and magnetic propertyparameters in different areas of the to-be-tested test sample can be measured, the adaptability is improved, and the operation is simple and convenient.

Description

technical field [0001] The invention relates to the technical field of electromagnetic measurement, in particular to a single-chip magnetic permeability meter, a single-chip sample measuring device and a measuring method. Background technique [0002] The no-load loss of the amorphous alloy iron core distribution transformer is low, only equivalent to 35% of the ordinary three-level energy efficiency silicon steel transformer, and the effect of energy saving and loss reduction is obvious. At present, the commonly used test methods for the no-load loss magnetic properties of amorphous alloy strips that we are concerned about include the ring sample method and the single piece sample method. The main disadvantage of the ring sample test method is that the preparation process is lengthy, and the excitation coil needs to be uniform Wound around the entire ring, the sample needs to be decompressed and annealed after winding, especially in the case of low excitation, the measureme...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/12G01R33/02
CPCG01R33/02G01R33/12G01R33/1215G01R33/123
Inventor 吴雪杨富尧刘洋高洁程灵何承绪马光韩钰陈新
Owner GLOBAL ENERGY INTERCONNECTION RES INST CO LTD
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