A test system and test method

Abstract

The embodiment of the invention relates to the technical field of automatic control, and discloses a test system and a test method. The test system in the present invention comprises: test host subsystem, real-time test simulation calculation subsystem and signal interface subsystem; test host subsystem generates the peripheral environment model and test code of the tested piece; real-time test simulation calculation subsystem runs test code and The peripheral environment model generates the test signal for the DUT and transmits it to the signal interface subsystem; the signal interface subsystem performs signal conditioning according to the test signal, and then transmits the conditioned test signal to the DUT; the DUT is adjusted according to The final test signal generates actual feedback data, and transmits the actual feedback data to the test host subsystem, and the test host subsystem forms a test report. The test system can realize real-time dynamic closed-loop test, has universality, can automatically generate test code without writing programs, and reduces test time and cost.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of automatic control, in particular to a test system and a test method. Background technique [0002] Embedded controllers usually control objects in special fields, and their function failure may lead to catastrophic consequences or significant economic losses. Therefore, embedded system controllers have very high requirements on reliability. This requires rigorous testing, validation and verification of embedded controllers to improve product reliability. In the production, delivery and maintenance stages of embedded controllers, a large number of strict software and hardware tests need to be carried out. Therefore, a convenient and fully functional test system has become a necessary condition for the production, scientific research and guarantee of embedded controllers. [0003] The inventor finds that there are at least the following problems in the prior art: the embedded co...

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Problems solved by technology

[0003] The inventor finds that there are at least the following problems in the prior art: the embedded controller test system used in the test of the existing embedded controller production, scientific research and guarantee stage is usually based on the windows system and is a non-real-time operating system. Some dynamic characteristics of embedded controller software cannot be tested; and the existing test system is usually a special test system developed for a certain type of software, the test software is not universal, testers cannot modify the test software, or it is difficult to modify the test software ; In addition, the existing test system usually only tests for a certain function, and cannot achieve full coverage of the test function, and needs to use multiple sets of test equipment for testing

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