Test system and test method

Abstract

Embodiments of the invention relate to the technical field of automatic control, and disclose a test system and a test method. The test system comprises a test host subsystem, a real-time test simulation calculation subsystem and a signal interface subsystem, wherein the test host subsystem is used for generating a peripheral environment model of a tested piece and a test code; the real-time testsimulation calculation subsystem is used for operating the test code and the peripheral environment model, generating a test signal for the tested piece and transmitting the test signal to the signalinterface subsystem; the signal interface subsystem is used for carrying out signal conditioning according to the test signal and transmitting the conditioned test signal to the tested piece; and thetested piece is used for generating practical feedback data according to the conditioned test signal, transmitting the practical feedback data to the test host subsystem and forming a test report by the test host subsystem. The test system is capable of realizing real-time dynamic closed-loop test, has universality, and is capable of automatically generating test codes without compiling programs so as to decrease the test time and cost.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of automatic control, in particular to a test system and a test method. Background technique [0002] Embedded controllers usually control objects in special fields, and their function failure may lead to catastrophic consequences or significant economic losses. Therefore, embedded system controllers have very high requirements on reliability. This requires rigorous testing, validation and verification of embedded controllers to improve product reliability. In the production, delivery and maintenance stages of embedded controllers, a large number of strict software and hardware tests need to be carried out. Therefore, a convenient and fully functional test system has become a necessary condition for the production, scientific research and guarantee of embedded controllers. [0003] The inventor finds that there are at least the following problems in the prior art: the embedded co...

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Problems solved by technology

[0003] The inventor finds that there are at least the following problems in the prior art: the embedded controller test system used in the test of the existing embedded controller production, scientific research and guarantee stage is usually based on the windows system and is a non-real-time operating system. Some dynamic characteristics of embedded controller software cannot be tested; and the existing test system is usually a special test system developed for a certain type of software, the test software is not universal, testers cannot modify the test software, or it is difficult to modify the test software ; In addition, the existing test system usually only tests for a certain function, and cannot achieve full coverage of the test function, and needs to use multiple sets of test equipment for testing

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