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A kind of high temperature annealing method of patterned thin film

A patterned film and high-temperature annealing technology, which is applied in the manufacture of electrical components, circuits, semiconductors/solid-state devices, etc., can solve problems such as cracking of patterned films, achieve good shape, simple process, and avoid damage

Active Publication Date: 2020-12-11
JILIN JIANZHU UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a method for high-temperature annealing of patterned films for the problem of cracking after high-temperature annealing of patterned films in the prior art

Method used

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  • A kind of high temperature annealing method of patterned thin film
  • A kind of high temperature annealing method of patterned thin film
  • A kind of high temperature annealing method of patterned thin film

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Embodiment 1

[0037] This embodiment is used to illustrate the high temperature annealing method of the patterned thin film disclosed in the present invention.

[0038] (1) In N-type Si / SiO 2 High-precision inkjet printing equipment is used to print patterned film liquid, in which the solvent is ethylene glycol methyl ether, and the film-forming material is indium zinc oxide. Observing the patterned film liquid through a ZEISS optical microscope, it is in a liquid state, such as Figure 1a shown.

[0039] (2) Set the pre-annealing temperature to 120°C. The temperature was raised to 120° C. at a heating rate of 5° C. / min, and maintained in an air environment for 1 hour, and a pre-annealing treatment was performed on the patterned film solution to obtain a film precursor. Observation by ZEISS optical microscope shows that after the pre-annealing treatment, the morphology of the micropattern has begun to solidify and is no longer in a liquid state, such as Figure 1b shown.

[0040] (3) Se...

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Abstract

In order to overcome the cracking after the high-temperature annealing of a patterned film in the prior art, a high-temperature annealing method for a patterned film is provided, comprising the stepsof: S1, forming a liquid patterned film liquid on a substrate, wherein the patterned film liquid comprises a film forming material and a solvent; S2, pre-annealing the patterned film liquid at a pre-annealing temperature to obtain a film precursor, wherein the pre-annealing temperature is 4 to 5 degree centigrade lower than the boiling point of the solvent; S3, subjecting the film precursor to a transition annealing treatment at a transition annealing temperature to obtain a film transition body, wherein the transition annealing temperature is lower than the target annealing temperature by 100to 150 degree centigrade; S4, annealing the film transition body at a target annealing temperature, and then cooling the film transition body to obtain a film. The film prepared by the high-temperature annealing method provided by the invention does not break and has high quality. The method provides good supporting conditions for improving the performance of the patterned film.

Description

technical field [0001] The invention belongs to the field of preparation of nano-optoelectronic materials, in particular to a high-temperature annealing method for patterned thin films. Background technique [0002] Printed electronics is the preparation of specific functional materials into liquid ink, according to the design requirements of electronic devices and product performance, printing technology, to achieve the production of electronic components and system products characterized by large area, flexibility, and light film. Although the resolution and integration of printed electronic components and products cannot reach the level of traditional silicon-based microelectronic devices, printed electronic technology has its own unique advantages, which are superior to the limitations of traditional technology and save Removing cumbersome processes such as exposure, development, and etching, has the advantages of low energy consumption, less material waste, green and po...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/477
CPCH01L21/477
Inventor 闫兴振王冠达周路杨帆迟耀丹高晓红边虹宇史恺李旭杨小天
Owner JILIN JIANZHU UNIVERSITY
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