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Fyback power supply with testability analysis and fault diagnosis functions and test method thereof

A technology of testability analysis and flyback power supply, which is applied in the direction of power supply testing, etc., can solve problems such as difficulty in obtaining fault information, difficulty in testability analysis and fault diagnosis, difficulty in obtaining key test node data information, etc., and achieve high portability sexual effect

Inactive Publication Date: 2018-08-07
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existing power supply is not testable. When it fails, it is difficult to obtain the data information of each key test node, that is, the corresponding fault information is difficult to obtain, which makes it difficult to analyze its testability and fault diagnosis.

Method used

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  • Fyback power supply with testability analysis and fault diagnosis functions and test method thereof
  • Fyback power supply with testability analysis and fault diagnosis functions and test method thereof
  • Fyback power supply with testability analysis and fault diagnosis functions and test method thereof

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specific Embodiment approach 1

[0022] Specific implementation mode one: the following combination figure 1 This embodiment will be described. The flyback power supply with testability analysis and fault diagnosis functions described in this embodiment is composed of a flyback power supply module 1 and a host computer system 2, wherein:

[0023] The flyback power supply module 1 is a constant current source with an output current of 700mA selected from an LED drive power supply. There are a total of 14 key test nodes 1-1 in each part of the circuit.

[0024] The host computer system 2 is connected to the flyback power supply module 1, and is controlled by the host computer system 2 to complete the collection of voltage signals of the corresponding key test nodes 1-1.

specific Embodiment approach 2

[0025] Specific implementation mode two: this implementation mode is a further description of specific implementation mode one, combined below figure 2 This embodiment will be described. The flyback power supply module 1 described in this embodiment includes 14 key test nodes 1-1 in total, including the input voltage point, output voltage point, feedback voltage point, optocoupler input voltage point, optocoupler output voltage of the flyback power supply point, reference voltage point, MOSFET gate voltage point, MOSFET source voltage point, MOSFET drain voltage point, etc. Such as figure 2 Shown, TP 1 400V input voltage, TP 2 is the drain voltage, TP 3 is the source voltage, TP 4 is the gate voltage, TP 5 is the auxiliary supply voltage, TP 6 is the optocoupler output voltage, TP 7 Output 15V voltage for NCP1230, TP 8 is the diode input voltage, TP 9 is the output voltage, TP 10 Supply voltage for TL431, TP 11 Supply voltage for op amp, TP 12 is the reference v...

specific Embodiment approach 3

[0026] Specific implementation mode three: this implementation mode is a further description of specific implementation mode one, combined below image 3 This embodiment will be described. The upper computer system 2 described in this embodiment includes a data communication 2-1, a data processing interface 2-2, a testability analysis interface 2-3 and a fault diagnosis interface 2-4, wherein:

[0027] The data communication 2-1 is the communication between the host computer system 2 and the flyback power supply module 1, mainly including the host computer system 2 sending instructions to the chip STM32 in the power board to control its measurement of the voltage data of the test node Afterwards, the chip STM32 in the power board transmits the data to the upper computer system 2 again.

[0028] The data processing interface 2-2 is composed of a feature parameter selection 2-2-1 and a waveform display before and after processing 2-2-2. After the setting of selected characteri...

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Abstract

The invention discloses a flyback power supply with the testability analysis and fault diagnosis functions and a test method thereof. The flyback power supply is composed of a flyback power supply module and an upper computer system. A plurality of key testing nodes are arranged in the flyback power supply module; and the upper computer system is connected with the flyback power supply module. According to the invention, on the basis of not changing the original topology of the flyback power supply, the power supply is divided into a plurality of modules based on functions and key testing nodes of all modules are taken and are led out; and the upper computer is used for real-time monitoring, extracting a fault feature parameter, and constructing a fault-testing correlation matrix, so thatthe testability analysis of the flyback power supply as well as the fault diagnosis of the flyback power supply is realized. The flyback power supply having high portability is suitable for state monitoring and testability analysis of most of switch power supplies and is capable of providing a platform for state monitoring and testability analysis of other power supplies.

Description

technical field [0001] The invention belongs to the technical field of switching power supplies, and relates to a power supply testability analysis and fault diagnosis method, in particular to a flyback power supply and a test method with testability analysis and fault diagnosis functions. Background technique [0002] As the main equipment to complete electric energy conversion and power transmission, the power supply can supply power for loads such as control modules, computers, relays, etc., and is one of the most important units in the power electronic system. In recent years, the rapid development of electronic technology has made people have higher requirements for electronic instruments and equipment. However, the existing power supply is not testable. When it fails, it is difficult to obtain the data information of each key test node, that is, the corresponding fault information is difficult to obtain, which makes it difficult to analyze its testability and fault dia...

Claims

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Application Information

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IPC IPC(8): G01R31/40
CPCG01R31/40
Inventor 翟国富陈丽影牛皓杨彦木子叶雪荣
Owner HARBIN INST OF TECH
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