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Chip excitation method, device and system, computer equipment and storage medium

A computer program and chip technology, which is applied in the field of integrated circuit testing, can solve the problems of not being able to catch up with the analysis speed of incentive information and the slow data transmission speed of storage devices, and achieve the effect of increasing the speed of excitation and decompression

Active Publication Date: 2018-08-17
ZHUHAI JIELI TECH
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Problems solved by technology

In the process of realizing the present invention, the inventors found that there are at least the following problems in the prior art: affected by the data transmission speed of the interface, the data transmission speed of the storage device may be very slow, and may even fail to catch up with the analysis speed of the incentive information, thereby causing many problems. question

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  • Chip excitation method, device and system, computer equipment and storage medium
  • Chip excitation method, device and system, computer equipment and storage medium
  • Chip excitation method, device and system, computer equipment and storage medium

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Embodiment Construction

[0026] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0027] With the development of the integrated circuit industry, chips began to enter thousands of households. Chips designed and produced need to be tested to filter out defective products before they are put into use. The mainstream integrated circuit testing follows the following process:

[0028] 1. Store the test vector in a certain device. After reading the test vector, the testing machine parses the stimulus data contained in the test vector and the expected chip response information, and sends the stimulus signal to the chip under test according to the timing required by the test. .

[00...

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Abstract

The invention relates to a chip excitation method, a chip excitation device, a chip excitation system, computer equipment and a storage medium and belongs to the technical field of integrated circuittests. The method comprises the following steps of decomposing compressed excitation data into a plurality of pieces of data to obtain a plurality of compressed excitation sub-data; grouping the plurality of compressed excitation sub-data, and respectively decompressing each group of compressed excitation sub-data through a plurality of decomposition units to obtain a plurality of excitation sub-data; integrating the plurality of excitation sub-data to obtain the excitation data; and inputting the excitation data into a chip for excitation. With the above-mentioned technical scheme, the problem that the data transmission speed of storage equipment is slow or even cannot catch up with the analysis speed of excitation information due to the influence of the data transmission speed of an interface is solved, the decompression speed for the compressed excitation data is improved and the speed for excitation of the chip is further improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to a chip excitation method, device, system, computer equipment and storage medium. Background technique [0002] With the development of the integrated circuit industry, chips began to enter thousands of households. Chips designed and produced need to be tested to filter out defective products before they are put into use. An important step in chip testing is to stimulate the chip. The traditional chip incentive process mainly includes: storing the incentive data in an external storage device, and after the testing machine reads the incentive information, it sends the incentive information to the chip for chip activation. In the process of realizing the present invention, the inventors found that there are at least the following problems in the prior art: affected by the data transmission speed of the interface, the data transmission speed of the storage device...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F3/06
CPCG06F3/061G06F3/0638G06F3/0673
Inventor 冯逸宇
Owner ZHUHAI JIELI TECH
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