Internet of things testing method and device

A test method and technology of the Internet of Things, applied in the direction of network data management, wireless communication, electrical components, etc., can solve problems such as unable to meet the access to a large number of terminals

Active Publication Date: 2022-08-02
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The method and device for testing the Internet of Things provided by the embodiments of the present invention mainly solve the technical problem that when testing the Internet of Things in the prior art, it is impossible to meet the problem of accessing a large number of terminals under the condition of limited hardware resources of the test equipment.

Method used

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  • Internet of things testing method and device

Examples

Experimental program
Comparison scheme
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Embodiment 1

[0033] In order to solve the problem in the prior art that when testing the Internet of Things, when the test equipment cannot meet the requirements of accessing a large number of terminals, additional hardware resources have to be added to access more terminals for testing, which leads to an increase in testing costs. This embodiment provides An Internet of Things test method, it should be noted that the Internet of Things test method provided in this embodiment can be applied to the NB-IoT Internet of Things test, or can also be applied to other Internet of Things tests that need to access multiple test terminals, For details, please refer to figure 1 shown, including:

[0034] S101: Acquire the configuration data of the blank test terminal on the test device and the virtual SIM card to be tested.

[0035] First, the configuration data of the virtual SIM card to be tested in this embodiment is described. Each virtual SIM card to be tested in this embodiment has its correspo...

Embodiment 2

[0073] In order to better understand the present invention, this embodiment provides a more specific Internet of Things test method based on the first embodiment in combination with three specific scenarios for further illustration.

[0074] In the first example provided in this embodiment, there are 1000 virtual SIM cards that need to be connected to the NB-IoT Internet of Things for testing, but the test equipment can only provide 500 blank test terminals. Access to the NB-IoT Internet of Things and enable data exchange, please refer to Image 6 As shown, the IoT test methods provided by this example include:

[0075] S601: Obtain configuration data of 1000 virtual SIM cards in batches.

[0076] Here, it is assumed that the 1000 pieces of configuration data in step S601 are SIM1-SIM1000.

[0077] S602: Obtain 500 blank test terminals on the test equipment.

[0078] The manner of acquiring the blank test terminal in this embodiment may be acquired by referring to the manne...

Embodiment 3

[0134] This embodiment provides an IoT test device, please refer to Figure 9 As shown, it includes: an acquisition module 91, a writing module 92, and a processing module 93, wherein the acquisition module 91 is used to acquire the blank test terminal on the test equipment and the configuration data of each virtual SIM card to be tested, and the blank test terminal includes and The circuit resources for realizing the SIM function corresponding to the virtual SIM card to be tested; the writing module 92 is used to write the configuration data of the corresponding virtual SIM card to be tested into the corresponding blank test terminal according to the preset writing rule to form a network access and data An effective test terminal with interactive functions; the processing module 93 is used to connect the effective test terminal to the Internet of Things to be tested, and save the configuration data and networking configuration information of the virtual SIM card to be tested i...

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Abstract

Embodiments of the present invention provide a method and device for testing the Internet of Things. By writing the acquired configuration data of a virtual SIM card to be tested into a corresponding blank test terminal, an effective test terminal is formed to access the Internet of Things to be tested, and the effective test terminal is The configuration data and networking configuration information of the virtual SIM card to be tested in it are saved as a virtual test terminal, which is used to restore the blank test terminal to obtain a valid test terminal when the virtual SIM card to be tested interacts with the test data of the Internet of Things to be tested. In order to exchange test data with the Internet of Things to be tested, that is, the blank test terminal only needs to be tested by the virtual test terminal corresponding to the virtual SIM card to be tested when there is test data interaction between the virtual SIM card to be tested and the Internet of Things to be tested. In other cases, the corresponding blank test terminal is in an unoccupied state, so that it can be used repeatedly, so more test terminals can be accessed without increasing the hardware cost, reducing the number of test terminals. cost.

Description

technical field [0001] The present invention relates to the technical field of wireless communication, and in particular, to a method and device for testing the Internet of Things. Background technique [0002] NB-IoT (Narrow Band Internet of Things, Narrow Band Internet of Things) is one of the many technologies of Low Power Wide Access (LPWA), which can support the cellular data connection of low power devices in the WAN. [0003] NB-IoT has four major characteristics: First, wide coverage, which can provide improved indoor coverage. In the same frequency band, NB-IoT has a gain of 20dB compared to the existing network, and the coverage area is expanded by 100 times; second, it has the ability to support massive connections. One sector of NB-IoT can support 100,000 connections, supporting low latency sensitivity, ultra-low equipment cost, low power consumption and optimized network architecture; the third is lower power consumption, NB-IoT terminal module The standby time...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04W8/18H04W24/06
CPCH04W8/183H04W24/06
Inventor 姚静沈媛王延鹏
Owner ZTE CORP
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