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Method for screening and classifying flash memory particles

A flash memory particle and classification technology, applied in the storage field, can solve problems such as inability to accurately distinguish between strong and weak, flash classification errors, and increased error rates

Active Publication Date: 2018-10-12
SHENZHEN YILIAN INFORMATION SYST CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At the same time, as the temperature increases, the greater the impact, the higher the error rate
[0007] The existing general technical solutions cannot accurately distinguish the strength of each block, resulting in errors in Flash classification and reduced reliability of SSD products.

Method used

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  • Method for screening and classifying flash memory particles
  • Method for screening and classifying flash memory particles
  • Method for screening and classifying flash memory particles

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Embodiment Construction

[0027] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0028] By proposing a new NAND Flash screening strategy: use the "temperature change test method" as the overall detection method, and use the "comparative classification method" to judge the strength of each Block, so as to distinguish the NAND Flash grade, including the use of particles for screening And the identification of early "weak blocks" and "bad blocks".

[0029] The method of "temperature change test method" is to write data in low temperature or high t...

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Abstract

The invention discloses a method for screening and classifying flash memory particles, comprising: obtaining the error rate information of each block of the flash memory particles written under different temperature conditions and read at different temperatures by the temperature change test method; using a comparing classification method to judge the strength of each Block according to the obtained bit error rate information, and finally distinguishing the NAND Flash level according to the distribution of the number of strong and weak Blocks in the FLASH. By separating the writing and readingtemperatures, the reading process is performed at multiple temperatures after a given temperature is given to collect the information data of the Block, which can effectively judge the strength of the Block, thereby accurately classifying the Flash to satisfy the product demand of SSD.

Description

technical field [0001] The invention relates to the field of storage technology, in particular to a method for screening and grading flash memory particles. Background technique [0002] figure 1 It is a schematic diagram of the composition of a typical NAND Flash; the channel DIE can operate independently and concurrently; a DIE includes several Blocks. A block that can be erased independently. The entire block must be erased before use. Each block includes several pages. Page: Read and write unit. "Bad block" refers to a block that cannot be used permanently due to reasons such as reliability. [0003] figure 2 As shown, in the traditional method of screening, read and write operations are performed at a constant temperature (high temperature or low temperature) to identify particle grades. After starting the screening, first check whether the ambient temperature is under the required ambient temperature. If not, adjust the ambient temperature, start reading and writ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/50
CPCG11C29/50
Inventor 方浩俊徐伟华王猛
Owner SHENZHEN YILIAN INFORMATION SYST CO LTD
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