Degradation Modeling and Life Prediction Method of DMM for Surface Ship Equipment
A digital multimeter and life prediction technology, applied in design optimization/simulation, special data processing applications, geometric CAD, etc., can solve the problems that degradation modeling methods cannot solve engineering practical problems well
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0094] Based on the degradation test data of the multimeter under the combined action of temperature, relative humidity and salt spray in the experiment, the experimental degradation data includes five measurement indicators of the multimeter, DC voltage, DC current, AC voltage, AC current, and resistance. The degradation modeling method of this invention is used to predict the reliability of the table under the corresponding environmental stress profile in the future. The environmental stress (temperature, relative humidity, salt spray) profile settings of the multimeter in the experiment for one year are as follows: Figure 2-4 shown. The five performance indicators use the degradation data of the first nine months obtained in the experiment for model fitting, and then predict the reliability of the multimeter under the future environmental profile for two years. Assuming that the product performance degradation process obeys the Wiener motion with the cumulative effect ter...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com