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thermal analysis device

A thermal analysis device and thermal resistance technology, applied in the direction of material thermal analysis, measuring device, analyzing materials, etc., can solve the problems of poor cooling efficiency and inability to cool quickly, and achieve the effect of reducing the surrounding temperature

Active Publication Date: 2022-03-11
RIGAKU CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, in the differential scanning calorimeter with the structure disclosed in the prior art document, since it is a cooling structure in which the heat of the storage chamber is only conducted to the cooling block through the thermal resistor to dissipate heat, it has poor cooling efficiency and cannot Problems that cool down quickly

Method used

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Embodiment Construction

[0023] Hereinafter, an embodiment in which the present invention is applied to a differential scanning calorimeter will be described in detail with reference to the drawings.

[0024] In addition, it goes without saying that the present invention is not limited to a differential scanning calorimeter, and can be applied to various thermal analysis devices that perform measurement by heating and cooling a sample.

[0025] Figure 1 ~ Figure 3 The structure of the differential scanning calorimeter (thermal analysis device) of this embodiment is shown.

[0026] The differential scanning calorimeter of the present embodiment includes a sample heating unit for heating the samples (the sample to be measured and the standard sample in the differential scanning calorimeter) arranged inside the measurement chamber 11a. unit 10; and a cooling mechanism for cooling the surrounding of the sample.

[0027] The sample heating unit 10 includes a sample chamber 11 , a heater 12 , and an exte...

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Abstract

The present invention provides a thermal analysis device capable of efficiently reducing the ambient temperature of a sample. [Solution] Equipped with: a cooling jacket (20), which is arranged around the sample heating unit (10), circulates the cooling medium inside, and cools the heat dissipated from the sample heating unit (10) to the surroundings through the cooling medium. heat absorption; and a heat conduction member that contacts both the sample heating unit (10) and the cooling jacket (20) to conduct heat from the sample heating unit (10) to the cooling jacket (20). The heat conduction member includes: a cooling block (21) on which a cooling jacket (20) is mounted; and a thermal resistor (22) in contact with both the cooling block (21) and the sample heating unit (10).

Description

technical field [0001] The present invention relates to a method for heating or cooling a standard sample and a sample to be measured to measure the temperature difference between the standard sample and the sample to be measured, and for endothermic reactions and heat generation caused by changes in the state of the sample to be measured. Thermal analysis equipment such as differential scanning calorimeter (DSC) for reaction analysis. Background technique [0002] Japanese Patent Application Laid-Open No. 2007-198959 (hereinafter referred to as "prior art document") discloses such a thermal analysis device (differential scanning calorimeter). The differential scanning calorimeter disclosed in the prior art document is equipped with a structure for heating a storage chamber containing an object to be measured (sample to be measured) and a reference substance (standard sample) by a heater, and a cooling block for storing the chamber. The structure of the chamber for cooling....

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N25/20
CPCG01N25/20G01N25/4826
Inventor 则武弘一郎
Owner RIGAKU CORP