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Method and device for automatic detection of LED chip support failure

An LED chip and automatic detection technology, which is applied in image analysis, image enhancement, instruments, etc., can solve the problems of high cost and low efficiency, and achieve the effect of improving work efficiency and reducing costs

Active Publication Date: 2020-10-16
视睿(杭州)信息科技有限公司
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0005] The embodiment of the present application provides a method and device for automatic detection of LED chip support failures, at least to solve the technical problems of high cost and low efficiency caused by the prior art of relying on human eyes to identify the quality of LED chip support with a microscope

Method used

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  • Method and device for automatic detection of LED chip support failure
  • Method and device for automatic detection of LED chip support failure
  • Method and device for automatic detection of LED chip support failure

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Embodiment Construction

[0021] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is an embodiment of a part of the application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0022] It should be noted that the terms "first" and "second" in the description and claims of the present application and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate circumstances such...

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Abstract

A method and a device for automatically detecting the failure of an LED chip holder are disclosed. The method comprises the following steps: obtaining a picture of an LED chip holder to be detected; based on the pre-constructed scorer, the pictures of the LED chip holder to be detected being scored to obtain the corresponding scores of the LED chip holder to be detected, wherein, the correspondingscores of the LED chip holder to be detected are used for characterizing the fault level of the LED chip holder to be detected. The present application solves the technical problems of high cost andlow efficiency caused by the prior art in a manner that a microscope relies on a human eye to identify the quality of an LED chip holder.

Description

technical field [0001] The present application relates to the field of product detection, in particular to a method and device for automatic detection of LED chip support failures. Background technique [0002] In order to improve product quality, before packaging LED chips into lamp beads, manufacturers usually need to strictly screen LED chip holders to eliminate serious defects, such as surface contamination, broken wires and LED chip holders with redundant connections. [0003] The traditional screening process of LED chip holders is to put them under a microscope to identify and eliminate obviously unqualified products visible to the naked eye, which requires a lot of labor costs and cannot guarantee the stability of the screening quality, seriously affecting the work efficiency of enterprises and economic interests. [0004] Aiming at the problems of high cost and low efficiency caused by the way of using microscope to recognize the quality of the LED chip holder by h...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00
CPCG06T7/0004G06T2207/20081G06T2207/20084
Inventor 单书畅别晓辉别伟成
Owner 视睿(杭州)信息科技有限公司
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