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Integrated circuit chip and inspection method thereof

A technology of integrated circuits and inspection methods, applied in electrical testing/monitoring, instruments, control/regulation systems, etc., to solve problems such as circuit modules not functioning properly

Active Publication Date: 2019-01-04
POWERCHIP SEMICON MFG CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, when the voltage regulator inside the integrated circuit chip is broken and cannot supply power voltage to other circuit modules, these circuit modules will not work normally

Method used

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  • Integrated circuit chip and inspection method thereof
  • Integrated circuit chip and inspection method thereof
  • Integrated circuit chip and inspection method thereof

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Embodiment Construction

[0024] As used throughout the specification of this application, including the claims, the term "coupled (or connected)" may refer to any means of connection, direct or indirect. For example, if it is described that a first device is coupled (or connected) to a second device, it should be interpreted that the first device can be directly connected to the second device, or the first device can be connected to the second device through other devices or certain A connection means indirectly connected to the second device. In addition, wherever possible, components / members / steps using the same reference numerals in the drawings and embodiments represent the same or similar parts. Components / components / steps using the same symbols or using the same terms in different embodiments can refer to related descriptions.

[0025] figure 1 A schematic diagram of a circuit block of an integrated circuit chip 100 is shown. The integrated circuit chip 100 includes a target circuit 110 and a...

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Abstract

Disclosed are an integrated circuit chip and an inspection method thereof. The target circuit of the integrated circuit chip generates a target signal. The conversion detection circuit of the integrated circuit chip detects the conversion of the target signal during initialization to generate a conversion detection result. Whether the initialization of the target circuit is normal is judged according to the result of the conversion detection.

Description

technical field [0001] The present invention relates to a chip, and in particular to an integrated circuit chip and its inspection method. Background technique [0002] An integrated circuit chip contains multiple circuit modules. These circuit blocks work in cooperation with each other. When the initialization of any one of these circuit modules fails, the function of the integrated circuit chip will often be disabled. For example, when a voltage regulator inside the integrated circuit chip is broken and cannot supply power voltage to other circuit modules, these circuit modules will not work normally. When the function of the integrated circuit chip fails, in order to find out the crux of the problem, it is generally necessary to use expensive test machines to use probes to obtain the target signal of the target circuit in the integrated circuit chip (such as the power supply voltage output by the voltage regulator) ) to monitor whether the initialization of the target ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B23/02
CPCG05B23/0213G05B2219/24065
Inventor 江伟山
Owner POWERCHIP SEMICON MFG CORP