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CPU testing method and device and electronic device

A testing method and testing device technology, applied in the server field, can solve problems such as time-consuming and labor-intensive

Active Publication Date: 2019-01-11
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In view of this, the present invention provides a CPU testing method, device and electronic equipment to solve the time-consuming and labor-intensive problem of manually adjusting the delay parameter values ​​corresponding to each command

Method used

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  • CPU testing method and device and electronic device
  • CPU testing method and device and electronic device

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Embodiment Construction

[0070] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0071] The embodiment of the present invention provides a CPU testing method, referring to figure 1 , which can include:

[0072] S11. Execute the SETWP test on the CPU, determine and configure the execution time of the first command corresponding to the decay command in the SETWP test;

[0073] Specifically, refer to figure 2 , in the first half of the test, the SVID Dn and SVID Up commands are both fast. At this time, you only need to directly execute the...

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Abstract

The invention provides a CPU testing method and device and an electronic device. In the invention, decay commands in SETWP testing and the command execution time corresponding to each command after the decay command can be automatically configured, thereby realizing correct SETWP testing of the CPU and obtaining test results. According to the embodiment of the invention, the parameter value of thedelay corresponding to each command does not need to be adjusted manually.

Description

technical field [0001] The present invention relates to the server field, and more specifically, relates to a CPU testing method, device and electronic equipment. Background technique [0002] During the research and development process of server motherboards, detailed and strict tests are required to verify whether the functions of the motherboard are normal and whether the parameters meet the design standards. The central processing unit CPU is the core component on the motherboard, and its testing work is also a part of the focus. [0003] When executing the SETWP test on the CPU, after changing the SVID Dn command from fast to decay and changing the SETWP date from 22 to 32, the decay test starts. When the decay command and subsequent commands fail to execute, you need to manually adjust the delay parameter values ​​corresponding to each command so that the decay command and subsequent commands can be executed correctly. [0004] However, manually adjusting the delay p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2236G06F11/2273G06F11/24G06F11/263
Inventor 石德礼
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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