Device and method for sticking annular load net on transmission electron microscope sample
A transmission electron microscope sample and ring technology, which is applied to measuring devices, material analysis using wave/particle radiation, instruments, etc., can solve the problems of low sample preparation success rate and difficult operation, and achieve high sample preparation success rate and use The effect of convenience and simple structure
Pending Publication Date: 2019-01-22
INNER MONGOLIA UNIV OF TECH
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Problems solved by technology
[0005] In order to overcome the shortcomings of low success rate of sample preparation and difficult operation of the existing transmission electron microscope samples pasted with ring-shaped grids, the present invention provides a device and method for pasting ring-shaped grids with transmission electron microscope samples
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[0036] The following clearly and completely describes the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0037] figure 1 It is a schematic structural diagram of a device for attaching a circular carrier grid to samples for transmission electron microscopy provided in an embodiment of the present invention. Such as Figure 1-Figure 5 As shown, the embodiment of the present invention is a device for pasting ring-shaped grids for transmission electron microscope samples, including a base 1, the upper surface of the base 1 is provided with a concave square groove 2, and the base 1 includes a first integrally formed The operating end 1-1, the ...
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The invention discloses a device for sticking an annular load net on a transmission electron microscope sample. The device comprises a base, wherein a downward concave square groove is formed in the upper surface of the base which comprises a first operation end, a second operation end and a base bottom which are of an integrated structure; a square hole extending to the square groove forwards isformed in the rear end of the second operation end; a sample support seat is formed in the square hole; a cylindrical through hole in the sample support seat is provided with a sample support used forsticking a sample; a semi-circular groove for placing the annular load net is arranged between the first operation end and the second operation end on the upper surface of the base bottom; a positioning rotary knob for adjusting the sample support seat leftwards and rightwards is arranged on the second operation end of the base; and a micrmeter head with a ratchet wheel is installed on the firstoperation end of the base. The device can be used for sticking the annular load net on the transmission electron microscope sample. The method comprises the following steps: step 1, centering the sample; step 2, sticking the annular load net on the sample; and step 3, curing and separating. The device is simple in structure, simple to operate, convenient to use and high in sample preparation success rate.
Description
technical field [0001] The invention belongs to the technical field of material microstructure testing and characterization, and in particular relates to a device and a method for sticking a circular carrier grid to a transmission electron microscope sample. Background technique [0002] Transmission electron microscopy can provide information such as phase structure, element composition, and crystal defects while observing the microstructure of materials, and has become a powerful research tool for materials scientists. Conventional TEM samples are discs with a diameter of 3 mm. The edge thickness of the sample is tens of microns, and the thin area in the middle is usually only tens of nanometers thick. The edge of the sample is thicker because the sample has a certain strength during preparation, transfer and fixation, and it is not easy to be damaged, while the middle part is particularly thin because the penetration ability of the electron beam of the transmission electr...
Claims
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Login to View More IPC IPC(8): G01N23/2251G01N23/2202
CPCG01N23/2202G01N23/2251
Inventor 刘飞白朴存赵学平侯小虎崔晓明
Owner INNER MONGOLIA UNIV OF TECH