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A fully calibrated method for multiport s-parameter test setups

A parametric test and complete calibration technology, applied in the field of calibration, can solve the problem of many connection steps

Active Publication Date: 2020-08-04
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] In scheme 2, each single port needs to be calibrated with a single port, and all through connections need to be connected, and there are many connection steps

Method used

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  • A fully calibrated method for multiport s-parameter test setups
  • A fully calibrated method for multiport s-parameter test setups

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Embodiment Construction

[0047] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0048] A complete calibration method for multi-port S-parameter test equipment, its flow is as follows figure 2 shown, including the following steps:

[0049] Step 1: Set port calibration information, including the following steps:

[0050] Step 1.1: Set up the calibration port;

[0051] Step 1.2: Carry out the setting of each port calibration connector;

[0052] Step 1.3: Set up the calibration parts corresponding to each calibration connector;

[0053] Step 2: Process the port calibration kit;

[0054] Step 3: Process the thru calibration parts;

[0055] Step 4: For ports i and j, according to whether an adapter needs to be connected and whether they are the same reference receiver, process the through method, specifically including the following steps:

[0056] Step 4.1: If ports i and j can be connected to port i and port j without an...

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Abstract

The invention discloses a complete calibration method for a multi-port S parameter test device, and belongs to the field of calibration. The method comprises the following steps of firstly, arranginga calibration part used by a port; secondly, aiming at the design of a user and the hardware characteristics of the multi-port S parameter test device, extracting and calculating information of a direct connection method, direct connection measurement, a calibration method and the like, and generating calibration connection and measurement information; thirdly, calculating error terms of all portsby using the calibration measurement information; and finally, measuring a measured part and correcting a measured value. The method has the characteristics that the steps of calibration connection are few; when n ports are taken as an example, only n+2 standards can be connected at least; and system error calculation of all the ports is achieved.

Description

technical field [0001] The invention belongs to the field of calibration, and in particular relates to a complete calibration method for a multi-port S-parameter testing device. Background technique [0002] The number of DUT ports tested by the vector network analyzer is increasing. For the testing of multi-port devices, a multi-port S-parameter test device will be used. Test setups are usually based on a vector network analyzer, extended with a switch matrix. For the calibration of this type of test device, two-to-two port calibration is usually performed using two-port calibration, and then the DUT is connected to perform a two-to-two port test on the DUT. This method either cannot achieve complete port calibration, cannot eliminate the influence of crosstalk between ports, and reduces test accuracy; or the measurement connection steps are many and the measurement process is complicated. [0003] Existing solutions are based on two-port calibration, taking 6-port calibr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00
CPCG01R35/005
Inventor 庄志远袁国平郭永瑞李树彪杨明飞蔡洪坤
Owner CHINA ELECTRONIS TECH INSTR CO LTD