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A standard microhardness tester

A microhardness and standard technology, applied in the field of metrology, can solve problems such as large deviations in test results and test stability, large test force values, and inability to provide guidance, so as to avoid out-of-focus phenomena and reduce test force errors , The effect of reducing production costs

Active Publication Date: 2021-04-06
BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the lower limit of the force value of the standard microhardness tester is 0.4903N, and the test force value is relatively large, and the sample with small and thin characteristics will be pierced during the test
The lower limit of the force value of the working-level microhardness tester is 0.0098N, which meets the existing test requirements. However, due to the loose requirements of its various indicators, the test results and test stability deviate greatly, which cannot provide effective guidance.

Method used

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  • A standard microhardness tester
  • A standard microhardness tester
  • A standard microhardness tester

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Embodiment 1

[0052] Such as figure 1 As shown, a standard microhardness tester disclosed in this embodiment includes a test force loading system, an indentation measurement system, a turret conversion system, an automatic focusing system, and a control module. The test force loading system, indentation measurement system, tower conversion system, and autofocus system are all controlled by the control module. The test force loading system and indentation measurement system are connected through the tower conversion system, and the above three systems are installed together with the autofocus system on the device body.

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Abstract

A standard microhardness tester disclosed by the invention belongs to the field of measurement. The present invention includes sequentially connected test force loading system, indentation measurement system, tower conversion system, and automatic focusing system; the test force loading system, indentation measurement system, tower conversion system, and automatic focus system are all controlled by the control module; During the hardness test, the test force loading system generates the required test force value and applies it on the surface of the sample through the indenter. traces are measured. The test lower limit of the present invention is 0.0098N, and has the following advantages: (1) under the premise of ensuring the test measurement accuracy, the test force measurement range can be expanded; (2) the focus control precision is high, and the out-of-focus phenomenon can be avoided, ensuring verticality. The invention can provide practical, effective and reliable technical support for the development of new materials and techniques.

Description

technical field [0001] The invention belongs to the field of measurement, and in particular relates to a standard microhardness tester. [0002] technical background [0003] With the development of modern material surface engineering, such as vapor deposition, sputtering, ion implantation, high-energy beam surface modification, thermal spraying and microelectronics, integrated micro-opto-electromechanical systems and other fields, the thickness of the sample itself or the surface modification layer is increasing. The smaller the microhardness tester is, the more accurate and reliable the measurement is, and the smaller the test force value is, the less it will penetrate the test sample. At present, the lower limit of the force value of the standard microhardness tester is 0.4903N, and the test force value is relatively large, and the sample with small and thin characteristics will be pierced during the test. The lower limit of the force value of the working-grade microhardn...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N3/02G01N3/42
CPCG01N3/02G01N3/42
Inventor 石伟李杨
Owner BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA