Quick non-destructive judging method for unsound grains of single kernel crop

A determination method and technology for grains, which are applied in measuring devices, material analysis by optical means, instruments, etc., can solve the problems of imperfect detection results, low accuracy, time-consuming and labor-intensive of single-grain crops, and achieve detection results. Objective and accurate, flux discrimination, non-destructive testing effect

Active Publication Date: 2019-03-15
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] The technical problem to be solved by the present invention lies in the problems that the detection results of single-grain crop imperfect kernels in the prior art are basically completely dependent on the senses, the accuracy is not high, and time-consuming and labor-intensive.

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  • Quick non-destructive judging method for unsound grains of single kernel crop
  • Quick non-destructive judging method for unsound grains of single kernel crop
  • Quick non-destructive judging method for unsound grains of single kernel crop

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Embodiment Construction

[0031] The embodiments of the present invention are described in detail below. This embodiment is implemented on the premise of the technical solution of the present invention, and detailed implementation methods and specific operating procedures are provided, but the protection scope of the present invention is not limited to the following implementation example.

[0032] The following examples take the single-grain crop—wheat as an example to describe the present invention in detail. Such as figure 1 As shown, a method for fast and non-destructive determination of imperfect kernels of single-grain crops comprises the following steps:

[0033] S1: Collect single-grain crop samples. The collected single-grain crop samples are different varieties harvested at different times and from different origins. The total number of single-grain crop samples is 1000-3000. 25%-75% of the total number of samples. The imperfect kernels of single-grain crops include diseased kernels, insec...

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Abstract

The invention discloses a quick non-destructive judging method for unsound grains of a single kernel crop. The method comprises the following steps: S1, collecting a single kernel crop sample, detecting unsound grain condition of each single kernel crop and establishing a class information matrix; S2, collecting a near infrared spectrum of single grains of the single kernel crop; S3, constructinga near infrared judging and analyzing model of unsound grains of the single kernel crop; and S4, differentiating normal single kernel crop and unsound grain single kernel crop by means of the established model. The method has the advantages of being objective and accurate in detection result, free of damage to the sample in the detection process, quick and simple, and can judge the unsound grainsof the single kernel crop efficiently in a through manner.

Description

technical field [0001] The invention relates to a method for judging the quality of single-grain crops, and more particularly to a method for quickly and non-destructively judging imperfect kernels of single-grain crops. Background technique [0002] Imperfect kernels of single-grain crops refer to the kernels of single-grain crops that are damaged but still have use value, including diseased kernels, insect-eaten kernels, sprouted kernels, damaged kernels and moldy kernels. Imperfect kernels comprehensively reflect the yield and quality of single-grain crops during growth, harvest, circulation and storage, and are an important indicator for quality inspection of single-grain crops. However, at present, the detection of imperfect kernels of single-grain crops in my country still needs to rely entirely on artificial sensory identification, the results are not objective and accurate enough, the repeatability is poor, and the detection is time-consuming and labor-intensive. In...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/359
CPCG01N21/359
Inventor 吴跃进徐琢频范爽程维民王琦刘斌美刘晶
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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