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Method for preparing epitaxial wafer of light-emitting diode and epitaxial wafer thereof

A technology of light-emitting diodes and epitaxial wafers, which is applied to semiconductor devices, electrical components, circuits, etc., can solve problems such as uneven heat, influence distribution, and large differences in the uniformity of light emission of InGaN/GaN multi-quantum well layers. Luminous pass rate, heat uniformity, and the effect of improving uniformity

Active Publication Date: 2020-12-18
HC SEMITEK ZHEJIANG CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The centrifugal force on the substrate in the circular grooves of each circle is different, which will cause the surface of the substrate on the concentric circles with a smaller diameter to bulge upwards away from the bottom surface of the circular grooves, and the surface of the concentric circles with a larger diameter will bulge upwards. The surface of the substrate is sunken downward toward the bottom of the groove in the center of the circle, and the substrate on the turntable is warped to varying degrees
In addition, due to the warping of the substrate and the epitaxial layer, the heat transferred to the InGaN / GaN multi-quantum well layer will be uneven, which will affect the distribution of In in the InGaN / GaN multi-quantum well layer, thereby affecting the InGaN / GaN multi-quantum well layer. The uniformity of the luminous wavelength, so this setting will eventually make the uniformity of the InGaN / GaN multi-quantum well layer in the epitaxial wafers obtained in the same batch vary greatly, which will affect the luminous pass rate of the epitaxial wafers obtained in the same batch

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  • Method for preparing epitaxial wafer of light-emitting diode and epitaxial wafer thereof
  • Method for preparing epitaxial wafer of light-emitting diode and epitaxial wafer thereof
  • Method for preparing epitaxial wafer of light-emitting diode and epitaxial wafer thereof

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Embodiment Construction

[0027] In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0028] For the convenience of understanding the present invention, the structure of the turntable of MOCVD equipment is provided here, figure 1 is a structural schematic diagram of the turntable provided by the embodiment of the present invention, such as figure 1 As shown, the turntable 10 is provided with a plurality of circular grooves 101 , and the plurality of circular grooves 101 are distributed on a plurality of concentric circles 102 . It should be noted here that the center of the concentric circles 102 is the rotation center A of the turntable 10, and the circular grooves 101 on the turntable 10 are all set on the side of the turntable 10 facing the airflow of the MOCVD equipment.

[0029] Wherein, the turntable can be drive...

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Abstract

The invention discloses a method for preparing an epitaxial wafer of a light emitting diode and the epitaxial wafer, and belongs to the field of light emitting diode manufacturing. A plurality of substrates with AlN layers are placed in circular grooves distributed in a plurality of concentric circles in an MOCVD apparatus, and the composition of Al of the AlGaN layers grown on the AlN layers is controlled to increase with the increase of the diameter of the concentric circle. As the diameter of the concentric circle increases, the composition of Al in the AlGaN layers gradually increases, andthe surfaces of the AlGaN layers in the circular grooves change from a state of being recessed toward the bottom surfaces of the centers of the grooves to upwardly convex surfaces away from the bottom surfaces of the grooves. The tendency of this change is opposite to the tendency of the warpage on the surfaces of the substrates. Therefore, the surfaces of the AlGaN layers are more complete, andthe surface warpage of the AlGaN layers counteracts the warpage of the substrate surfaces and the heat transferred to an InGaN / GaN multiple quantum well layer is more uniform, which improves the uniformity of the emission wavelength of the InGaN / GaN multiple quantum well layer, and further improves the luminescence yield of the epitaxial wafer obtained in the same batch.

Description

technical field [0001] The invention relates to the field of light-emitting diode manufacturing, in particular to a method for preparing an epitaxial wafer of a light-emitting diode and the epitaxial wafer. Background technique [0002] Light-emitting diodes are semiconductor diodes that can convert electrical energy into light energy. They have the advantages of small size, long life, and low power consumption. They are currently widely used in automotive signal lights, traffic lights, display screens, and lighting equipment. The epitaxial wafer is the basic structure for making light-emitting diodes. The structure of the epitaxial wafer includes a substrate and an epitaxial layer grown on the substrate. Among them, the structure of the epitaxial layer mainly includes: AlN layer, GaN nucleation layer, undoped GaN layer, N-type GaN layer, InGaN / GaN multiple quantum well layer and P-type GaN layer grown on the substrate in sequence. [0003] When the current epitaxial layer ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/00H01L33/06
CPCH01L33/0075H01L33/06
Inventor 丁涛周飚胡加辉李鹏
Owner HC SEMITEK ZHEJIANG CO LTD