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Method and device for hot spot diagnosis of photovoltaic modules

A technology of photovoltaic modules and diagnostic methods, which is applied in the monitoring of photovoltaic systems, photovoltaic modules, photovoltaic power generation, etc., and can solve problems such as inability to diagnose bypass diode non-conductive hot spots

Active Publication Date: 2020-07-07
SUNGROW POWER SUPPLY CO LTD
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  • Claims
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Problems solved by technology

[0005] The invention provides a method and device for hot spot diagnosis of photovoltaic modules to solve the problem that the bypass diode non-conductive hot spot cannot be diagnosed in the prior art

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  • Method and device for hot spot diagnosis of photovoltaic modules
  • Method and device for hot spot diagnosis of photovoltaic modules
  • Method and device for hot spot diagnosis of photovoltaic modules

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Embodiment Construction

[0058] The following will clearly and completely describe the technical solutions in the embodiments of the application with reference to the drawings in the embodiments of the application. Apparently, the described embodiments are only some of the embodiments of the application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of this application.

[0059] The invention provides a method for diagnosing hot spots of photovoltaic components to solve the problem that the non-conductive hot spots of bypass diodes cannot be diagnosed in the prior art.

[0060] See figure 1 , the hot spot diagnosis method of the photovoltaic module specifically includes:

[0061] S101. Obtain IV curve scanning data of the photovoltaic module;

[0062] In practical applications, the IV curve scanning of the photovoltaic module to be tested can be performed th...

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Abstract

The invention provides a hot spot diagnosis method and device for a photovoltaic assembly. A hot spot problem is determined based on the linearity of a curve in a specific interval of an IV curve. Andthus a conduction type hot spot problem of a bypass diode of the IV curve with a step as well as a non-conduction type hot spot problem of a bypass diode of the IV curve without a step and with a distortion feature can be determined. Therefore, a problem of the diagnosis of the stepless hot spot assembly in the prior art is solved.

Description

technical field [0001] The invention relates to the technical field of hot spot diagnosis of photovoltaic modules, in particular to a method and device for hot spot diagnosis of photovoltaic modules. Background technique [0002] In photovoltaic power generation systems, in order to avoid hot spots in photovoltaic modules and affect their performance, hot spot diagnosis is usually required. Among the many hot spot diagnostic methods, the IV curve method has become a better choice because of its low cost and high accuracy. [0003] The IV curve method is mainly to make full use of the IV characteristic changes when hot spots occur to determine various failure types. Through horizontal and vertical comparisons, different failure types can be decoupled, not only for hot spot diagnosis, but also for other failure types. Make a diagnosis. [0004] However, since the characteristics of the bypass diode non-conductive hot spot are not obvious on the IV curve, the IV curve method ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H02S50/10G06F30/20
CPCG06F30/367H02S50/10Y02E10/50
Inventor 云平徐君
Owner SUNGROW POWER SUPPLY CO LTD
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