Marker-free far-field super-resolution microscopy system and method based on super-resolution lens

Abstract

The invention provides a non-marking far-field super-resolution microscope system and method based on a super-resolution lens. The system comprises a light source module, a super-resolution flat fieldscanning objective lens module, a sample two-dimensional scanning module, a non-marking microscopic detection module, a phase contrast module, a high speed signal acquisition module, a scan control module, a microscopic monitoring module and a computer and software module that in a reflection working mode and comprises the light source module, a super-resolution beam transmitting illumination module, the super-resolution flat field scanning objective lens module, the sample two-dimensional scanning module, the non-marking microscopic detection module, the phase contrast module, the high speedsignal acquisition module, the scan control module, the microscopic monitoring module and the computer and software module in a transmitting working mode. With the super-resolution flat field scanning objective lens module and the super-resolution illumination lens, the unmarked super-resolution resolution microscopic image of a three-dimensional sample is obtained rapidly in confocal mode; and the lateral resolution is lower than the diffraction limit.

Description

technical field [0001] The invention belongs to the field of visible light microscopy technology, in particular to far-field super-resolution microscopy technology, which is applied to the detection of biological samples, material samples and the like. Background technique [0002] The existing microscopy techniques can be roughly divided into two categories: near-field microscopy and far-field microscopy. Near-field microscopy includes microsphere-assisted imaging, near-field scanning microscopy and other methods. Near-field microscopy can achieve super-resolution microscopy imaging, but its working distance is smaller than the working wavelength, which greatly limits its practical application; far-field super-resolution technology, with a large working distance, can overcome the shortcomings of near-field microscopy . Existing far-field super-resolution microscopy techniques include stimulated emission depletion microscopy, local activation microscopy, random light recons...

AI Technical Summary

Problems solved by technology

In recent years, there have been a few experimental reports on label-free far-field super-resolution microscopy based on super-diffraction devices. However, such systems only use super-diffraction devices to achieve super-resolution illumination, and their collection lenses still use traditional optical microscope objectives. Greatly restricts the improvement of its resolution

Images