Processing method and device
A processing method and technology of predetermined location, applied in electrical digital data processing, instruments, computing and other directions, can solve problems such as spending a lot of time, complex types of problems, hard disk/memory data cannot be read and written, etc., to achieve hot repair and reduce work. The effect of improving the repair efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0067] refer to figure 1 , is a flow chart of Embodiment 1 of a processing method provided by this application. This method can be applied to but not limited to repairing system defects on user terminals (such as desktops, all-in-one machines, notebooks, etc.) or servers. This application In , the system defect refers to the defect in the operation of the equipment system, such as figure 1 As shown, the processing method may include the following steps:
[0068] Step 101. Obtain defect data of equipment system operation.
[0069] The defect data may include but not limited to: the data included in the log of the equipment system that can reflect the defects of the system operation, and / or the debug information (such as debug code) of the corresponding components of the system that can reflect the defects of the system Run defect data.
[0070] This application will mainly take the defect of the device system as a firmware defect as an example to illustrate the method of the...
Embodiment 2
[0083] refer to figure 2 , is a flow chart of Embodiment 2 of a processing method provided by this application. This Embodiment 2 continues to further detail the above processing method, as figure 2 As shown, in this embodiment, the processing method can be realized through the following processing procedures:
[0084] Step 201. Acquire in advance at least one piece of repair information for correcting defects in equipment system operation, and collect the acquired at least one piece of repair information to form the repair information set.
[0085] Each repair information in the repair information set can be used to correct a corresponding type of system defect, for example, the first repair information in the repair information set can correct the firmware defect of hard disk capacity / memory size identification error, The second repair information can correct the firmware defect that the hard disk / memory data cannot be read and written, the third repair information can co...
Embodiment 3
[0107] In the aforementioned embodiments, when the repair information set is searched based on the key defect information corresponding to the defect data, more than one repair information matching the key defect information can often be searched out, for example, when using the "hard disk / Memory read and write failure" (or a combination of "hard disk", "memory", "read and write failure", etc.) This key defect information When searching the repair information base based on SVN or Git, feedback results may appear In the case of multiple patch packs.
[0108] In actual application, due to various reasons such as firmware version, code differences of different suppliers, operating environment (such as the problem of compiling the patch package caused by the inconsistency of the operating environment), and the connection with other components in the device system, etc., based on key defects Some of the repair information obtained from the information cannot effectively solve the ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com