Keyboard matrix impedance test device

Abstract

The invention discloses a keyboard matrix impedance testing device, which includes: a test connector, one end of which has an interface for inserting the carbon ribbon of the keyboard, and the other end has a number of first pin holes arranged in sequence, and each of the first pin holes The foot holes are connected to the carbon ribbon pins of the carbon ribbon one by one, and the first pin holes are divided into the first area corresponding to the X axis of the keyboard matrix and the second area corresponding to the Y axis of the keyboard matrix; Connecting board, one end of which is connected to each of the first pin holes in the second area of ​​the test connector, and the other end has a plurality of second pin holes arranged in sequence, each of the second pin holes is connected to the The first pin holes in the second area are connected in one-to-one correspondence; the micro-ohmmeter has two probes, and each probe is respectively inserted into the first pin hole and the second pin hole. Therefore, the insertion is more convenient, the operation is simple, the insertion is accurate, and the contact is good; it is convenient for the operator to correctly select the corresponding first pin hole and the second pin hole.

Description

【Technical field】 [0001] The invention relates to a testing device, in particular to a keyboard matrix impedance testing device. 【Background technique】 [0002] When the keyboard is in the part sample approval, it is necessary to use a micro-ohmmeter to measure the contact impedance of each keycap (keycap) in the matrix, so as to know whether the contact condition is good and whether the function is normal. The contact impedance reflects whether the trigger point where each keycap of the keyboard is located is in good contact and the circuit is unblocked, so that there will be no malfunction, partial key failure, etc., and it will not lead to deviations in reliability in later use. The measurement of keyboard impedance is mainly in the detection of the contact circuit after the first arrival of the monomer, or after high temperature, low temperature, humidity, rain, dust, vibration and drop. [0003] Usually, the impedance specification of the keyboard matrix is ​​lower tha...

AI Technical Summary

Problems solved by technology

[0007] Therefore, the purpose of the present invention is to provide a keyboard matrix impedance testing device, which solves the problems of troublesome operation during testing and the inability to quickly achieve the testing purpose.

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