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AEP memory Error Detection function test method and system, terminal and storage medium

A technology of functional testing and memory, which is applied in functional testing, detecting faulty computer hardware, generating response errors, etc. It can solve the problems that AEP memory does not have a relatively complete testing method, and achieve high testing efficiency and wide application prospects , The effect of a simple test method

Inactive Publication Date: 2019-06-21
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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  • Abstract
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Problems solved by technology

[0004] However, since AEP memory is currently in the development stage, there is no relevant and complete test method for the function of AEP memory Error Detection

Method used

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  • AEP memory Error Detection function test method and system, terminal and storage medium
  • AEP memory Error Detection function test method and system, terminal and storage medium
  • AEP memory Error Detection function test method and system, terminal and storage medium

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Embodiment Construction

[0028] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0029] figure 1 is a schematic flowchart of a method in one embodiment of the present invention. in, figure 1 The execution subject may be an AEP memory Error Detection function test system.

[0030] Such as figure 1 As shown, the method 100 includes:

[0031] Step 110, utilize Intel XDP to carry out simulation error note to descri...

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Abstract

The invention provides an AEP memory Error Detection function test method and system, a terminal and a storage medium. The AEP memory Error Detection function test method comprises: using an Intel XDPto carry out simulation error injection on an AEP memory, and simulation error information is obtained; Checking the AEP error information in the BMC; And obtaining an Error Determining function testresult by verifying the consistency of the analog error information and the BMC error information. According to the method, the Error Decoding function of the AEP memory can be automatically tested,the test preciseness meets market requirements, the test method is simple, the test efficiency is high, the method does not depend on manual operation, and time and labor are saved.

Description

technical field [0001] The invention belongs to the technical field of server testing, and in particular relates to an AEP memory Error Detection function testing method, system, terminal and storage medium. Background technique [0002] At present, Intel has developed an AEP memory, which has a large capacity and many functions. At present, this AEP memory can be used as a hard disk and can be used for storage. At present, many major customers have gradually introduced development, such as: Ali, Tencent, Baidu, etc. [0003] The Error Detection function of the AEP memory can timely report the abnormal situation of the AEP memory, and report the error information including the error parameters and the location of the error to the server BMC, so that the operator can find and deal with the abnormality of the AEP memory in time. If the Error Detection function cannot be used normally, it will cause a delay in AEP memory error reporting, which may lead to the expansion of AEP...

Claims

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Application Information

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IPC IPC(8): G06F11/26G06F11/07
Inventor 梁恒勋
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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