Unlock instant, AI-driven research and patent intelligence for your innovation.

Face posture parameter evaluation method and device, electronic device and readable storage medium

A face posture and parameter evaluation technology, applied in the field of face recognition, can solve the problems of tediousness and low precision, and achieve the effect of improving calculation accuracy and calculation speed

Inactive Publication Date: 2019-06-25
XIAMEN MEITUZHIJIA TECH
View PDF10 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the prior art, the face pose parameters are generally obtained by transforming the key points of the face in the two-dimensional face image into three-dimensional space (for example, the SlovePnp method). This method needs to first estimate the key points in the two-dimensional face image The key points of the face are relatively cumbersome; and in the process of transforming the face from 2D to 3D, it relies on the average face model, which has low precision

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Face posture parameter evaluation method and device, electronic device and readable storage medium
  • Face posture parameter evaluation method and device, electronic device and readable storage medium
  • Face posture parameter evaluation method and device, electronic device and readable storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. The components of the embodiments of the application generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0043] Accordingly, the following detailed description of the embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of the application. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art w...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention provides a face posture parameter evaluation method and device, an electronic device and a readable storage medium. The method comprises the following steps: firstly, obtaining face posture parameters of a sample two-dimensional face image based on a pre-created face 3D model; secondly, inputting the two-dimensional face image of the sample and corresponding face posture parameters into a neural network for training to obtain a trained neural network; and finally, inputting the two-dimensional face image to be evaluated into the trained neural network for evaluation to obtain a face posture parameter. According to the scheme, the neural network is trained by adopting the two-dimensional face image of the sample and the corresponding face posture parameter, and the two-dimensional face image to be evaluated is input through the trained neural network, so that the corresponding face posture parameter can be obtained. Compared with an existing two-dimensional to three-dimensional face posture parameter estimation method, the calculation precision is improved, and meanwhile the calculation speed is also improved to a certain extent due to the fact that the two-dimensional face estimation process is omitted.

Description

technical field [0001] The present application relates to the technical field of face recognition, and in particular, relates to a method, device, electronic device and readable storage medium for evaluating face posture parameters. Background technique [0002] Face pose parameter estimation has a very wide range of applications in the field of face recognition, for example, it is used to help estimate the attention of the face, assist in face gaze tracking or face 3D modeling, etc. The face pose parameters generally include an angle of turning the face up and down (pitch), an angle of turning the face left and right (yaw), and a rotation angle of the face in the plane (roll). [0003] In the prior art, the face pose parameters are generally obtained by transforming the key points of the face in the two-dimensional face image into three-dimensional space (for example, the SlovePnp method). This method needs to first estimate the key points in the two-dimensional face image ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06K9/00G06K9/46G06T7/73G06T17/00
Inventor 刘志辉陈良许清泉张伟傅松林
Owner XIAMEN MEITUZHIJIA TECH