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A three-dimensional measurement method of structured light based on phase-shift encoding fringe order

A fringe level and three-dimensional measurement technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as phase unwrapping errors, achieve the effects of increasing noise resistance, ensuring accuracy, and solving phase unwrapping errors

Active Publication Date: 2021-02-09
SICHUAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The present invention provides a structured light three-dimensional measurement method based on phase shift encoding fringe order, aiming to solve the problem of phase unwrapping error caused by the height mutation region of the object to be measured in the traditional measurement algorithm

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  • A three-dimensional measurement method of structured light based on phase-shift encoding fringe order
  • A three-dimensional measurement method of structured light based on phase-shift encoding fringe order
  • A three-dimensional measurement method of structured light based on phase-shift encoding fringe order

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Embodiment Construction

[0057] A typical embodiment of a structured light three-dimensional measuring method based on the phase shift encoding fringe order of the present invention will be described in detail below, and the present invention will be further described in detail. It is necessary to point out that the following examples are only used for further description of the present invention, and cannot be interpreted as limiting the protection scope of the present invention, and those skilled in the art make some non-essential improvements to the present invention according to the above-mentioned content of the present invention And adjustments still belong to the protection scope of the present invention.

[0058] Step 1: Encoding the Sine Stripes

[0059] It includes two parts: the encoding of 3 frames of sinusoidal fringes required by the 3-step phase shifting algorithm with N=3 and the encoding of 5 frames of sinusoidal fringes with additional M=5 required for determining the order of fringe...

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Abstract

The invention provides a structured light three-dimensional measurement method based on phase shift encoding fringe order, and belongs to the field of structured light three-dimensional measurement. The method of the invention includes six steps of encoding sinusoidal fringes, calibrating the system, estimating the imaging area, collecting projected images, determining the order of the fringes and establishing the system pixel correspondence. The method of the present invention utilizes the phase shift amount to precode the fringe order, by adding M The phase shift of the frame sinusoidal fringes uniquely encodes the fringe levels, which reduces the number of images required to encode the fringe levels of high-frequency fringes; this method uses phase information as the coding unit, compared with gray information as the coding unit The binary fringe encoding method has stronger noise resistance; and the fringe level calculation is highly independent, and the graphics processor (Graphics Processing Unit, GPU) is used to accelerate it, which ensures the timeliness of the measurement method.

Description

technical field [0001] The invention relates to the field of three-dimensional measurement of structured light, in particular to a three-dimensional measurement method of structured light based on phase shift encoding fringe orders. Background technique [0002] Three-dimensional measurement of structured light is a key issue in the field of three-dimensional measurement. Its goal is to project computer-coded images through projectors, and cameras to collect images modulated by the surface of objects, and finally reconstruct the three-dimensional surface shape of objects. Compared with the passive three-dimensional measurement method, the structured light measurement method can more precisely reconstruct the three-dimensional surface shape of the object; compared with the active contact three-dimensional measurement method, the structured light as a means of active non-contact measurement can more accurately reconstruct the non-rigid The three-dimensional shape of an object....

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/2509G01B11/2513
Inventor 冯国英袁寒李洪儒包忠毅崔磊
Owner SICHUAN UNIV