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Control method and device for depth data acquisition of TOF sensor

A technology for acquiring depth and depth data, which is applied to measurement devices, instruments, and re-radiation of electromagnetic waves. quality effect

Inactive Publication Date: 2019-07-05
深圳市点云智能科技有限公司
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Problems solved by technology

[0003] However, when using the TOF sensor for imaging under the sun, due to the strong light, the data collected by the TOF sensor is usually easily overexposed, resulting in the deterioration of the depth image quality, so that it is impossible to accurately obtain the three-dimensional space position information

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  • Control method and device for depth data acquisition of TOF sensor
  • Control method and device for depth data acquisition of TOF sensor
  • Control method and device for depth data acquisition of TOF sensor

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Embodiment Construction

[0042] figure 1 It shows a flow chart of a control method for acquiring depth data by a TOF sensor according to a specific embodiment of the present invention. The control method of the present invention is used to control the degree of influence of the light intensity on the depth data acquired by the TOF depth sensor. The technical solution of the present invention establishes a relationship model between light intensity and optimal exposure time through mathematical modeling, and based on the model, predicts the optimal exposure time under different light intensities, and uses the TOF sensor to adaptively adjust when collecting depth data Exposure time, thereby eliminating or reducing the possibility of overexposure during the acquisition process and improving the quality of the acquired data.

[0043] Such as figure 1 As shown, first in step S101, a model database is established based on historical light intensity, historical exposure time and historical depth data, and ...

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Abstract

The invention discloses a control method and device for the depth data acquisition of a TOF sensor. The invention aims to control the degree of the influence of illumination intensity on the depth data acquisition of the TOF depth sensor. The method includes the following steps that: a, a model database is established based on historical illumination intensity, historical exposure time, and historical depth data, wherein the model database includes reference illumination intensity and reference exposure time which are in one-to-one correspondence with each other; b, actual illumination intensity is obtained, and actual exposure time corresponding to the actual illumination intensity is determined based on the model database; and c, depth data are acquired based on the actual exposure time.According to the control method and device of the invention, the exposure time can be adaptively set to be optimal exposure time predicted by the model of the invention according to the actual illumination intensity, and the quality of acquired depth data can be improved.

Description

technical field [0001] The invention belongs to the technical field of time-of-flight (TOF) sensors, and in particular relates to a control method and a device for acquiring depth data by a TOF sensor. Background technique [0002] Time-of-flight (TOF) technology means that the sensor emits modulated near-infrared light, which is reflected after encountering an object. The sensor calculates the distance between the light and the reflection time or phase difference, and then converts the distance of the object to generate depth information. Combined with traditional camera shooting, The three-dimensional outline of the object can be presented in different colors representing different distances. TOF sensor technology is widely used in the fields of drone flight obstacle avoidance, human-computer interaction and gesture recognition, machine positioning and intelligent navigation, human detection and object detection, industrial automation and unmanned driving. [0003] Howeve...

Claims

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Application Information

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IPC IPC(8): G01S17/89G01S17/08
CPCG01S17/89G01S17/08
Inventor 周秦娜
Owner 深圳市点云智能科技有限公司
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