A Descriptive Method for Structural Deformation of Spaceborne Microwave Remote Sensing Instruments

Abstract

The invention relates to a method for describing structural deformation of a space-borne microwave remote sensing instrument in the technical field of remote sensing instrument modeling methods, comprising the following steps: Step 1, defining fixed coordinate systems of each independent component in the instrument. Step 2, define the rotation deformation parameters and displacement deformation parameters of each reflector and feed source. Step 3, starting from the feed source, according to the rotation deformation parameters and displacement deformation parameters of the optical path components, calculate the coordinate system transformation matrix between adjacent optical path components. Step 4, substitute the coordinate system transformation matrix into the optical path model. The method for describing the structural deformation of a spaceborne microwave remote sensing instrument of the present invention can use the least deformation parameters to describe the structural deformation of a spaceborne microwave remote sensing instrument containing various components such as a plane reflecting surface, a rotating paraboloid reflecting surface, and a rotating hyperboloid reflecting surface. , which is helpful for the optical path modeling of the subsequent space-borne microwave remote sensing instrument under the condition of structural deformation.

Description

technical field [0001] The invention relates to the technical field of modeling methods for remote sensing instruments, in particular to a method for describing structural deformation of spaceborne microwave remote sensing instruments. Background technique [0002] The construction of the precise satellite imaging geometric model is the core of the geometric correction scheme based on the remote sensing instrument imaging model. There are long-period and short-period changes in satellite platform attitude, orbital position, thermal environment, and mechanical environment, which make the line of sight of the instrument deviate from the nominal direction, resulting in deviations in the correspondence between image pixels and geographic locations. [0003] The attitude and orbit changes of the satellite platform can be accurately measured and then compensated or corrected. However, the on-orbit deformation mechanism of the satellite platform and instruments caused by factors su...

AI Technical Summary

Problems solved by technology

However, this method simplifies the modeling of the internal distortion of the instrument, and cannot fully describe the deformation of the scanning microwave imaging instrument

Images