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Software defect data acquisition system based on code semantics and background information

A data acquisition system and software defect technology, which is applied in the fields of electrical digital data processing, software testing/debugging, computer parts, etc., can solve the problems of small data set data, class imbalance, and low marking accuracy.

Active Publication Date: 2019-08-16
BEIHANG UNIV
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  • Abstract
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  • Application Information

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Problems solved by technology

[0007] The purpose of the present invention is to provide a software defect data collection system based on code semantics and background information to solve the problem of small amount of data in the current software defect data set, high feature repeatability, serious class imbalance, lack of related features of software semantic information, The lack of software function information and defect specific information, as well as the slow acquisition efficiency of current software defect data sets, low labeling accuracy, and high labor and time costs make it difficult to timely collect defects that meet the current deep learning software defect prediction based on code semantics data problem

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  • Software defect data acquisition system based on code semantics and background information
  • Software defect data acquisition system based on code semantics and background information
  • Software defect data acquisition system based on code semantics and background information

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Embodiment Construction

[0050] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0051] In view of the current software defect data set data volume is small, the feature repeatability is high, the class imbalance problem is serious, the lack of software semantic information related features, the lack of software function information and defect specific information, and the current software defect data set acquisition efficiency is slow, marking The problem of low accuracy, high labor and time costs, and difficulty in ...

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Abstract

The invention discloses a software defect data acquisition system based on code semantics and background information. The software defect data acquisition system comprises a data analysis module, a data acquisition module, a data processing module and a database module. A merging request workflow of a GitHub website is used as a mark index. The software defect data including software defect codesand software defect background information is acquired, and the defects that most software defect data acquisition methods are small in data size, insufficient in data source, lack of background information, poor in data marking accuracy and serious in class imbalance are overcome.

Description

Technical field [0001] The invention relates to the technical field of software defect prediction and software reliability, in particular to a software defect data collection system based on code semantics and background information. Background technique [0002] Since the 21st century, the status of software in social life has been increasing day by day, and it is ubiquitous. It is not only limited to professional fields such as engineering, scientific research, and economics, but has also entered thousands of households and has become an important tool in people's lives. With the increasing of the scale of software system and the geometric increase in complexity, the defects of software are also increasing day by day, and the impact of software defects also radiates to all aspects of people's lives. [0003] Software defect data is the basis of software reliability related research and application. For a long time, the defect data used in the field of software reliability mainly...

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Application Information

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IPC IPC(8): G06F11/36G06K9/62G06N20/00
CPCG06F11/3604G06F11/366G06N20/00G06F18/24
Inventor 艾骏许嘉熙王飞郭皓然邹卓良施韬
Owner BEIHANG UNIV